参数资料
| 型号： | ATSAM3N1AA-AU |
| 厂商： | Atmel |
| 文件页数： | 19/60页 |
| 文件大小： | 0K |
| 描述： | MCU FLASH 48-QFP |
| 产品培训模块： | Touch Solutions on the Atmel ARM? Cortex?-M3 Based Flash Microcontrollers |
| 特色产品： | SAM3N Flash MCU |
| 标准包装： | 250 |
| 系列： | SAM3N |
| 核心处理器： | ARM? Cortex?-M3 |
| 芯体尺寸： | 32-位 |
| 速度： | 48MHz |
| 连通性： | I²C，IrDA，SPI，UART/USART |
| 外围设备： | 欠压检测/复位，DMA，POR，PWM，WDT |
| 输入/输出数： | 34 |
| 程序存储器容量： | 64KB（64K x 8） |
| 程序存储器类型： | 闪存 |
| RAM 容量： | 8K x 8 |
| 电压 - 电源 (Vcc/Vdd)： | 1.62 V ~ 3.6 V |
| 数据转换器： | A/D 8x10b |
| 振荡器型： | 内部 |
| 工作温度： | -40°C ~ 85°C |
| 封装/外壳： | 48-LQFP |
| 包装： | 托盘 |
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11011BS–ATARM–22-Feb-12
SAM3N Summary
6.3
Test Pin
The TST pin is used for JTAG Boundary Scan Manufacturing Test or Fast Flash programming
mode of the SAM3N series. The TST pin integrates a permanent pull-down resistor of about 15
k
Ω to GND, so that it can be left unconnected for normal operations. To enter fast programming
mode, see the Fast Flash Programming Interface (FFPI) section. For more on the manufacturing
and test mode, refer to the “Debug and Test” section of the product datasheet.
6.4
NRST Pin
The NRST pin is bidirectional. It is handled by the on-chip reset controller and can be driven low
to provide a reset signal to the external components or asserted low externally to reset the
microcontroller. It will reset the Core and the peripherals except the Backup region (RTC, RTT
and Supply Controller). There is no constraint on the length of the reset pulse and the reset con-
troller can guarantee a minimum pulse length. The NRST pin integrates a permanent pull-up
resistor to VDDIO of about 100 k
Ω . By default, the NRST pin is configured as an input.
6.5
ERASE Pin
The ERASE pin is used to reinitialize the Flash content (and some of its NVM bits) to an erased
state (all bits read as logic level 1). It integrates a pull-down resistor of about 100 k
Ω to GND, so
that it can be left unconnected for normal operations.
This pin is debounced by SCLK to improve the glitch tolerance. When the ERASE pin is tied high
during less than 100 ms, it is not taken into account. The pin must be tied high during more than
220 ms to perform a Flash erase operation.
The ERASE pin is a system I/O pin and can be used as a standard I/O. At startup, the ERASE
pin is not configured as a PIO pin. If the ERASE pin is used as a standard I/O, startup level of
this pin must be low to prevent unwanted erasing. Please refer to Section 11.2 “Peripheral Sig-
nals Multiplexing on I/O Lines” on page 42. Also, if the ERASE pin is used as a standard I/O
output, asserting the pin to low does not erase the Flash.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| ATSAM3N1AA-MU | 功能描述:ARM微控制器 - MCU IND TEMP MRLA RoHS:否 制造商:STMicroelectronics 核心:ARM Cortex M4F 处理器系列:STM32F373xx 数据总线宽度:32 bit 最大时钟频率:72 MHz 程序存储器大小:256 KB 数据 RAM 大小:32 KB 片上 ADC:Yes 工作电源电压:1.65 V to 3.6 V, 2 V to 3.6 V, 2.2 V to 3.6 V 工作温度范围:- 40 C to + 85 C 封装 / 箱体:LQFP-48 安装风格:SMD/SMT |
| ATSAM3N1AB-AU | 功能描述:ARM微控制器 - MCU LQFP, Grn, IT, MRL B RoHS:否 制造商:STMicroelectronics 核心:ARM Cortex M4F 处理器系列:STM32F373xx 数据总线宽度:32 bit 最大时钟频率:72 MHz 程序存储器大小:256 KB 数据 RAM 大小:32 KB 片上 ADC:Yes 工作电源电压:1.65 V to 3.6 V, 2 V to 3.6 V, 2.2 V to 3.6 V 工作温度范围:- 40 C to + 85 C 封装 / 箱体:LQFP-48 安装风格:SMD/SMT |
| ATSAM3N1AB-AUR | 制造商:Atmel Corporation 功能描述:. - LQFP,GREEN,IND TEMP,MRL B,T&R - Tape and Reel 制造商:Atmel Corporation 功能描述:IC MCU 32BIT 64KB FLASH 48LQFP |
| ATSAM3N1AB-MU | 功能描述:ARM微控制器 - MCU QFN,Grn, IT, MRL B RoHS:否 制造商:STMicroelectronics 核心:ARM Cortex M4F 处理器系列:STM32F373xx 数据总线宽度:32 bit 最大时钟频率:72 MHz 程序存储器大小:256 KB 数据 RAM 大小:32 KB 片上 ADC:Yes 工作电源电压:1.65 V to 3.6 V, 2 V to 3.6 V, 2.2 V to 3.6 V 工作温度范围:- 40 C to + 85 C 封装 / 箱体:LQFP-48 安装风格:SMD/SMT |
| ATSAM3N1AB-MUR | 制造商:Atmel Corporation 功能描述:. - QFN,GREEN,IND TEMP,MRL B,T&R - Tape and Reel 制造商:Atmel Corporation 功能描述:IC MCU 32BIT 64KB FLASH 48QFN |
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