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参数资料
| 型号： | ATTL7583BAJ-D |
| 厂商： | LEGERITY INC |
| 元件分类： | 通信及网络 |
| 英文描述： | SPECIALTY TELECOM CIRCUIT, PDSO28 |
| 封装： | PLASTIC, SOG-28 |
| 文件页数： | 2/21页 |
| 文件大小： | 398K |
| 代理商： | ATTL7583BAJ-D |
10
Data Sheet
February 2001
L7583A/B/C/D Line Card Access Switch
Switching Behavior
When switching from the power ringing state to the idle/talk
state, via simple logic level input control, the L7583 is able
to provide control with respect to the timing when the ring-
ing access contacts are released relative to the state of the
line break contacts.
Make-before-break operation occurs when the line break
switch contacts are closed (or made) before the ringing
access switch contact is opened (or broken). Break-before-
make operation occurs when the ringing access contact is
opened before the line break switch contacts are closed.
Using the logic level input pins RING, TESTin, and TEST-
out, either make-before-break or break-before-make opera-
tion of the L7583 is easily achieved. The logic sequences for
tion of logic states.
When using an L758X in the make-before-break mode, dur-
ing the ring-to-idle transition, for a period of up to one-half
the ringing frequency, the ring break switch and the pnpn-
type ring access switch can both be in the ON state. This is
the maximum time after the logic signal at INRING has transi-
tioned that the ring access
switch is waiting for the next zero current cross, so it can
close. During this interval, current that is limited to the dc
break switch current-limit value will be source from the ring
node of the SLIC.
This current is presented to the internal protection circuit. If
the SCR-type protector is used (A or C codes), if by random
probability the ring-to-idle transition occurs during a portion
of the ring cycle when the ringing voltage exceeds the pro-
tection circuit SCR turn-on voltage, and if current in excess
of the SCR’s turn-on current is also available, the SCR may
turn on. Once the SCR is triggered on, if the SLIC is capable
of supplying current in excess of the holding current, the
SCR may be latched on by the SLIC.
The probability of this event depends on the characteristics
of the given SLIC and of the holding current of the L7583 A
or C device. The SCR hold current distribution is designed to
be safely away from the test limit of
80 mA. The higher the distribution, the lower the probability
of the latch.
If this situation is of concern for a given board design, either
use the A or C series device in the break-before-make mode
(eliminates the original 25 ms current pulse) or use a B or D
series device (eliminates the SCR).
Table 13. Make-Before-Break Operation
RING TESTin TESTout
TSD
State
Timing
Break
Switches
3 & 4
Ring
Return
Switch 7
Ring
Access
Switch 8
All Other
Access
Switches
5 V
0 V
Float
Power
Ringing
—Open
Closed
Open
0 V
Float
Make-
before-
break
SW8 waiting for next
zero current crossing to
turn off maximum
time—one-half of ring-
ing. In this transition
state, current that is
limited to the dc break
switch current-limit
value will be sourced
from the ring node of
the SLIC.
Closed
Open
Closed
Open
0 V
Float
Idle/Talk Zero cross current has
occurred.
Closed
Open
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相关代理商/技术参数 |
参数描述 |
|---|---|
| ATTL7583BAJ-DT | 制造商:AGERE 制造商全称:AGERE 功能描述:Line Card Access Switch |
| ATTL7583BCG | 制造商:未知厂家 制造商全称:未知厂家 功能描述:LH1263 E&M Signaling Circuit |
| ATTL7583BF | 制造商:未知厂家 制造商全称:未知厂家 功能描述:LH1263 E&M Signaling Circuit |
| ATTL7583CAJ-D | 制造商:AGERE 制造商全称:AGERE 功能描述:Line Card Access Switch |
| ATTL7583CAJDT | 制造商:AGERE 功能描述:New |
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