参数资料
型号: BS62UV2006TCP10
厂商: BRILLIANCE SEMICONDUCTOR, INC.
英文描述: Ultra Low Power/Voltage CMOS SRAM 256K X 8 bit
中文描述: 超低功率/电压CMOS SRAM的256K × 8位
文件页数: 3/9页
文件大小: 320K
代理商: BS62UV2006TCP10
R0201-BS62UV2006
Revision 1.1
Jan.
2004
3
BSI
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP. (1)
MAX.
UNITS
VDR
Vcc for Data Retention
CE1 ≧ Vcc - 0.2V or CE2 ≦ 0.2V,
VIN ≧ Vcc - 0.2V or VIN ≦ 0.2V
1.0
--
V
ICCDR
(3)
Data Retention Current
CE1 ≧ Vcc - 0.2V or CE2 ≦ 0.2V,
VIN ≧ Vcc - 0.2V or VIN ≦ 0.2V
--
0.1
1.0
uA
tCDR
Chip Deselect to Data
Retention Time
0
--
ns
tR
Operation Recovery Time
See Retention Waveform
TRC
(2)
--
ns
1. Typical characteristics are at TA = 25oC.
2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.
3. Fmax = 1/t
RC .
4. IccsB1 is 2.0uA/3.0uA at Vcc=2.0V/3.0V and TA=70oC.
5. VIL = -1.5V for pulse width less than 30ns.
DATA RETENTION CHARACTERISTICS ( TA = -40oC to + 85oC )
1. Vcc = 1.0V, TA = + 25OC
2. t
RC = Read Cycle Time
3. IccDR is 0.7uA at TA=70oC.
DC ELECTRICAL CHARACTERISTICS ( TA = -40oC to + 85oC )
LOW VCC DATA RETENTION WAVEFORM (1) ( CE1 Controlled )
CE1
Data Retention Mode
Vcc
t CDR
Vcc
t R
VIH
Vcc
VDR
1.0V
CE1
Vcc - 0.2V
LOW VCC DATA RETENTION WAVEFORM (2) ( CE2 Controlled )
CE2
Data Retention Mode
Vcc
t CDR
Vcc
t R
VIL
Vcc
VDR ≧ 1.0V
CE2 ≦ 0.2V
PARAMETER
NAME
PARAMETER
TEST CONDITIONS
MIN. TYP. (1) MAX.
UNITS
Vcc=2.0V
--
0.6
VIL
Guaranteed Input Low
Voltage
(2)
Vcc=3.0V
-0.3
(5)
--
0.8
V
Vcc=2.0V
1.4
--
VIH
Guaranteed Input High
Voltage
(2)
Vcc=3.0V
2.0
--
Vcc+0.3
V
IIL
Input Leakage Current
Vcc = Max, VIN = 0V to Vcc
--
1
uA
ILO
Output Leakage Current
Vcc = Max, CE1 = VIH or CE2=VIL
or OE = VIH, VI/O = 0V to Vcc
--
1
uA
Vcc = Max, IOL = 0.1mA
Vcc=2.0V
--
0.2
VOL
Output Low Voltage
Vcc = Max, IOL = 2.0mA
Vcc=3.0V
--
0.4
V
Vcc = Min, IOH = -0.1mA
Vcc=2.0V
Vcc-0.2
--
VOH
Output High Voltage
Vcc = Min, IOH = -1.0mA
Vcc=3.0V
2.4
--
V
Vcc=2.0V
--
10
ICC
Operating Power Supply
Current
Vcc = Max, CE1= VIL, CE2=VIH
IDQ = 0mA, F = Fmax
(3)
Vcc=3.0V
--
13
mA
Vcc=2.0V
--
0.1
ICCSB
Standby Current-TTL
Vcc = Max, CE1 = VIH or
CE2=VIL
IDQ = 0mA
Vcc=3.0V
--
0.5
mA
Vcc=2.0V
--
0.20
3.0
ICCSB1
(4)
Standby Current-CMOS
Vcc = Max, CE1≧Vcc-0.2V or
CE2≦0.2V ;VIN≧ Vcc - 0.2V or
VIN≦0.2V
Vcc=3.0V
--
0.30
5.0
uA
BS62UV2006
相关PDF资料
PDF描述
BS62UV2006TCP85 Ultra Low Power/Voltage CMOS SRAM 256K X 8 bit
BS62UV2006TI Ultra Low Power/Voltage CMOS SRAM 256K X 8 bit
BS62UV2006TI-85 Ultra Low Power/Voltage CMOS SRAM 256K X 8 bit
BS62UV256 Ultra Low Power/Voltage CMOS SRAM 32K X 8 bit
BS62UV256DC Ultra Low Power/Voltage CMOS SRAM 32K X 8 bit
相关代理商/技术参数
参数描述
BS-632-1 制造商:PennEngineering (PEM) 功能描述:
BS6322 制造商:n/a 功能描述:Ships in 2 days
BS-632-2 制造商:PennEngineering (PEM) 功能描述:
BS640GBC3V 制造商:AMD 制造商全称:Advanced Micro Devices 功能描述:64 Megabit (4 M x 16-Bit), 1.8 Volt-only Simultaneous Read/Write, Burst Mode Flash Memory
BS640GBC4V 制造商:AMD 制造商全称:Advanced Micro Devices 功能描述:64 Megabit (4 M x 16-Bit), 1.8 Volt-only Simultaneous Read/Write, Burst Mode Flash Memory