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参数资料
| 型号： | BX80547RE2933C |
| 厂商： | INTEL CORP |
| 元件分类： | 微控制器/微处理器 |
| 英文描述： | 32-BIT, 2930 MHz, MICROPROCESSOR, PBGA775 |
| 封装： | FLIP CHIP, LGA-775 |
| 文件页数： | 13/94页 |
| 文件大小： | 2796K |
| 代理商： | BX80547RE2933C |
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20
Datasheet
Electrical Specifications
2.5
Reserved, Unused, and TESTHI Signals
All RESERVED signals must remain unconnected. Connection of these signals to VCC,VSS, VTT,
or to any other signal (including each other) can result in component malfunction or
incompatibility with future processors. See Chapter 4 for a land listing of the processor and the
location of all RESERVED signals.
For reliable operation, always connect unused inputs or bidirectional signals to an appropriate
signal level. In a system level design, on-die termination has been included on the Celeron D
processor in the 775-land package to allow signals to be terminated within the processor silicon.
Most unused GTL+ inputs should be left as no connects, as GTL+ termination is provided on the
processor silicon. However, see Table 2-4 for details on GTL+ signals that do not include on-die
termination. Unused active high inputs should be connected through a resistor to ground (VSS).
Unused outputs can be left unconnected; however, this may interfere with some test access port
(TAP) functions, complicate debug probing, and prevent boundary scan testing. A resistor must be
used when tying bidirectional signals to power or ground. When tying any signal to power or
ground, a resistor will also allow for system testability. For unused GTL+ input or I/O signals, use
pull-up resistors of the same value as the on-die termination resistors (R
TT). Refer to Table 2-17 for
more details.
TAP, GTL+ Asynchronous inputs, and GTL+ Asynchronous outputs do not include on-die
termination. Inputs and used outputs must be terminated on the system board. Unused outputs may
be terminated on the system board or left unconnected. Note that leaving unused outputs
unterminated may interfere with some TAP functions, complicate debug probing, and prevent
boundary scan testing.
The TESTHI signals must be tied to the processor VTT using a matched resistor, where a matched
resistor has a resistance value within ±20% of the impedance of the board transmission line traces.
For example, if the trace impedance is 60
Ω, then a value between 48 Ω and 72 Ω is required.
The TESTHI signals may use individual pull-up resistors or be grouped together as detailed below.
A matched resistor must be used for each group:
TESTHI[1:0]
TESTHI[7:2]
TESTHI8 – cannot be grouped with other TESTHI signals
TESTHI9 – cannot be grouped with other TESTHI signals
TESTHI10 – cannot be grouped with other TESTHI signals
TESTHI11 – cannot be grouped with other TESTHI signals
TESTHI12 – cannot be grouped with other TESTHI signals
TESTHI13 – cannot be grouped with other TESTHI signals
2.6
FSB Signal Groups
The FSB signals have been combined into groups by buffer type. GTL+ input signals have
differential input buffers, which use GTLREF as a reference level. In this document, the term
"GTL+ Input" refers to the GTL+ input group as well as the GTL+ I/O group when receiving.
Similarly, "GTL+ Output" refers to the GTL+ output group as well as the GTL+ I/O group when
driving.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| BX80547RE2933C S L7TP | 制造商:Intel 功能描述: 制造商:Intel 功能描述:MPU CELERON D 90NM 2.93GHZ 775PIN FCLGA4 - Boxed Product (Development Kits) |
| BX80547RE2933CNS L98X | 制造商:Intel 功能描述:32BIT MPU BX80547RE2933CN 2.93 |
| BX805499010 | 制造商:Intel 功能描述:ITANIUM 1.60 GHZ - Boxed Product (Development Kits) |
| BX805499015 | 制造商:Intel 功能描述:DUAL-CORE ITANIUM 1.40 GHZ - Boxed Product (Development Kits) |
| BX805499020 | 制造商:Intel 功能描述:DUAL-CORE ITANIUM 1.42 GHZ - Boxed Product (Development Kits) |
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