参数资料
型号: CBTD3306
厂商: NXP Semiconductors N.V.
英文描述: Dual bus switch with level shifting
中文描述: 双总线电平转换开关
文件页数: 4/8页
文件大小: 76K
代理商: CBTD3306
Philips Semiconductors
Product data
CBTD3306
Dual bus switch with level shifting
2001 Nov 08
4
AC CHARACTERISTICS
T
amb
= –40 to +85
°
C; C
L
= 50 pF
TO
LIMITS
SYMBOL
PARAMETER
FROM (INPUT)
(OUTPUT)
V
CC
= +5.0 V
±
0.5 V
MIN
UNIT
MAX
t
pd
Propagation delay
1
A or B
B or A
0.25
ns
t
en
Output enable time
to High and Low level
Output disable time
from High and Low level
OE
A or B
1
5
ns
t
dis
OE
A or B
1
4.9
ns
NOTE:
1. The propagation delay is the calculated RC time constant of the typical on-state resistance of the switch and the specified load capacitance,
when driven by an ideal voltage source (zero output impedance).
AC WAVEFORMS
V
M
= 1.5 V, V
IN
= GND to 3.0 V
INPUT
1.5 V
OUTPUT
t
PLH
t
PHL
SA00028
1.5 V
1.5 V
1.5 V
3 V
0 V
V
OH
V
OL
Waveform 1. Input to Output Propagation Delays
Output Control
(Low-level
enabling )
1.5 V
t
PZH
t
PHZ
V
OH
V
OL
t
PZL
t
PLZ
3.5 V
0 V
V
OL
+ 0.3 V
V
OH
– 0.3 V
SA00029
1.5 V
1.5 V
1.5 V
0 V
3 V
Output
Waveform 1
S1 at 7 V
(see Note)
Note:
Waveform 1 is for an output with internal conditions such that
the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that
the output is high except when disabled by the output control.
Output
Waveform 2
S1 at Open
(see Note)
Waveform 2. 3-State Output Enable and Disable Times
NOTES:
1. t
PLZ
and t
PHZ
are the same as t
dis
.
2. t
PZL
and t
PZH
are the same as t
en
.
3. t
PLH
and t
PHL
are the same as t
pd
.
TEST CIRCUIT AND WAVEFORMS
C
L
= 50 pF
500
Load Circuit
DEFINITIONS
C
L
=
Load capacitance includes jig and probe capacitance;
see AC CHARACTERISTICS for value.
TEST
S1
t
pd
open
t
PLZ
/t
PZL
7 V
t
PHZ
/t
PZH
open
SA00012
500
From Output
Under Test
S1
7 V
Open
GND
NOTES:
1. All input pulses are supplied by generators having the following
characteristics: PRR
10 MHz, Z
O
= 50
, t
r
2.5 ns, t
f
2.5 ns.
2. The outputs are measured one at a time with one transition per
measurement.
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