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参数资料
| 型号： | CRB1A2E000T |
| 厂商： | AVX Corporation |
| 文件页数： | 3/6页 |
| 文件大小： | 0K |
| 描述： | RES ARRAY 0.0 OHM 2 RES 0606 |
| 标准包装： | 5,000 |
| 系列： | CRB, Kyocera |
| 电路类型： | 隔离 |
| 电阻（欧姆）： | 0.0 |
| 电阻数： | 2 |
| 引脚数： | 4 |
| 每个元件的功率： | 62.5mW |
| 容差： | 跳接器 |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 0606（1616 公制），凹陷 |
| 尺寸/尺寸： | 0.063" L x 0.063" W（1.60mm x 1.60mm） |
| 高度： | 0.024"（0.60mm） |
| 包装： | 带卷 (TR) |
| 工作温度： | -55°C ~ 125°C |
Chip Resistor Arrays
CR, CJ, CRA, CRB, CRC Series - Test Conditions
MECHANICAL CHARACTERISTICS
Item
Standard
Test Conditions
Resistor
Jumper
Resistor
Jumper
R/R
±(1%+0.05 ? ) max.
of the initial value
50m ? max.
Apply the load as shown:
Measure resistance during load application
millimeters (inches)
20
Terminal
Strength
Visual
No evidence of mechanical damage after loading
Bending in
10 seconds
R230
50
(0.787) (1.969)
± 2 (0.079)max
[ φ 5 (0.197)]
45 (1.772) 45 (1.772)
PC Board = Glass epoxy t = 1.60 (0.063)
Soldering
Heat
Resistance
R/R
Visual
±(1%+0.05 ? ) max.
of the initial value
No evidence of leaching
50m ? max.
Immerse into molten solder at 260±5°C for 10±1 sec.
Stabilize component at room temperature for 1 hr.
Measure resistance.
Solderability
Coverage ≥ 95% each termination end
Immerse in Rogin Flux for 2±0.5 sec. and in
SN62 solder at 235±5°C for 2±0.5 sec.
Anti-Vibration
Test
Solvent
Resistance
R/R
Visual
R/R
Visual
±(1%+0.1 ? ) max.
of the initial value
No evidence of mechanical damage
±(0.5%+0.05 ? ) max.
of the initial value
No evidence of mechanical damage
50m ? max.
50m ? max.
2 hrs. each in X, Y and Z axis. (TTL 6 hrs.) 10 to 55 Hz
sweep in 1 min. at 1.5mm amplitude.
Immerse in static state butyl acetate at 20°C to 25°C
for 30±5 sec.
Stabilize component at room temperature for 30 min.
then measure value.
ENVIRONMENTAL CHARACTERISTICS
Item
Standard
Test Conditions
Resistor
Jumper
Resistor
Jumper
Temperature
Cycle
Low
Temperature
Storage
High
Temperature
Storage
Moisture
Resistance
Life Test
Loading Life
in Moisture
R/R
Visual
R/R
Visual
R/R
Visual
R/R
Visual
R/R
Visual
R/R
Visual
±(1%+0.05 ? ) max.
of the initial value
No evidence of mechanical damage
±(2%+0.1 ? ) max.
of the initial value
No evidence of mechanical damage
±(3%+0.1 ? ) max.
of the initial value
No evidence of mechanical damage
±(3%+0.1 ? ) max.
of the initial value
No evidence of mechanical damage
±(3%+0.1 ? ) max.
of the initial value
No evidence of mechanical damage
±(3%+0.1 ? ) max.
of the initial value
No evidence of mechanical damage
50m ? max.
50m ? max.
50m ? max.
50m ? max.
50m ? max.
50m ? max.
(1) Run 5 cycles as follows: -55±3°C for 30 min.
125±3°C for 30 min. Room temp. for 10-15 min.
(2) Stabilize component at room temperature for 1 hr.
then measure value.
-0
(1) Dwell in -55°C chamber without loading for 1000 +48
hrs.
(2) Stabilize component at room temperature for 1 hr.
then measure value.
-0
(1) Dwell in 125°C chamber without loading for 1000 +48
hrs.
(2) Stabilize component at room temperature for 1 hr.
then measure value.
(1) Dwell in temp.: 65°C RH90 to 95% RH chamber
-0
without loading for 1000 +48 hrs.
(2) Stabilize component at room temperature for 1 hr.
then measure value.
(1) Temp.: 70±3°C Voltage: (rated voltage) on 90 min.
-0
off 30 min. Duration: 1000 +48 hrs.
(2) Stabilize component at room temperature for 1 hr.
then measure value.
-0
(1) Temp.: 40±2°C RH: 90-95% Voltage Cycle: on 90
min. (rated voltage) off 30 min. Duration: 1000 +48 hrs.
(2) Stabilize component at room temperature for 1 hr.
then measure value.
10
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