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参数资料
| 型号： | CRB2A4E822JT |
| 厂商： | AVX Corporation |
| 文件页数： | 4/7页 |
| 文件大小： | 0K |
| 描述： | RES ARRAY 8.2K OHM 4 RES 0804 |
| 标准包装： | 5,000 |
| 系列： | CRB, Kyocera |
| 电路类型： | 隔离 |
| 电阻（欧姆）： | 8.2k |
| 电阻数： | 4 |
| 引脚数： | 8 |
| 每个元件的功率： | 62.5mW |
| 容差： | ±5% |
| 温度系数： | ±250ppm/°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 0804（2010 公制），凹陷 |
| 尺寸/尺寸： | 0.079" L x 0.039" W（2.00mm x 1.00mm） |
| 高度： | 0.016"（0.40mm） |
| 包装： | 带卷 (TR) |
| 工作温度： | -55°C ~ 125°C |
Test Conditions and Standards
CRB, CRC Series
Mechanica l Characteristics
Item
Standard
Test Conditions
Resistor
Jumper
Resistor
Jumper
D R/ R
± (1% + 0.05 W ) max.
of the initial value
50m W max.
Apply the load as show:
Measure resistance during load application
Terminal
Strength
Visual
No evidence of mechanical damage after loading
PC board: Glass epoxy t = 1.6
50m W max.
SolderingHeat
Resistance
D R/ R
Visual
± (1% + 0.05 W ) max.
of the initial value
No evidence of leaching
Immerse into molten solder at 260 ± 5 ° C for 10 ± 1 sec.
Stabillize component at room temperature for 1hr.
Measure resistance.
Solderability
Coverage ≥ 95% each termination end
Immerse in Rogin Flux for 2 ± 0.5 sec. and in
SN62 solder at 235 ± 5 ° C for 2 ± 0.5 sec.
50m W max.
50m W max.
Anti-Vibration
Test
Solvent
Resistance
D R/ R
Visual
D R/ R
Visual
± (1% + 0.1 W ) max.
of the initial value
No evidence of mechanical damage
± (0.5% + 0.05 W ) max.
of the initial value
No evidence of mechanical damage
2 hrs. each in X, Y and Z axis. (TTL 6hrs.) 10 to 55 Hz
sweep in 1 min. at 1.5mm amplitude.
Immerse in static state butyl acetate at 20 ° C to 25 ° C
for 30 ± 5 sec.
Stabillize component at room temperature for 30 min.
then measure value.
Environmental Characteristics
Item
Standard
Test Conditions
Resistor
Jumper
Resistor
Jumper
Temperature
Cycle
D R/ R
± (1% + 0.05 W ) max.
of the initial value
50m W max.
1) Run 5 cycles as follows: ? 55 ± 3 ° C for 30 min.
125 ± 3 ° C for 30 min. Room temp. for 10 to 15 min.
2) Stabilize component at room temperature for 1hr.
then measure value.
Visual
No evidence of mechanical damage
50m W max.
50m W max.
50m W max.
50m W max.
50m W max.
Low
Temperature
Storage
High
Temperature
Storage
Moisture
Resistance
Life Test
Loading Life
in Moisture
D R/ R
Visual
D R/ R
Visual
D R/ R
Visual
D R/ R
Visual
D R/ R
Visual
± (2% + 0.1 W ) max.
of the initial value
No evidence of mechanical damage
± (3% + 0.1 W ) max.
of the initial value
No evidence of mechanical damage
± (3% + 0.1 W ) max.
of the initial value
No evidence of mechanical damage
± (3% + 0.1 W ) max.
of the initial value
No evidence of mechanical damage
± (3% + 0.1 W ) max.
of the initial value
No evidence of mechanical damage
1) Dwell in ? 55 ° C chamber without loading for
1000 + ? 48 0 hrs.
2) Stabilize component at room temperature for 1hr.
then measure value.
1) Dwell in 125 ° C chamber without loading for
1000 + ? 48 0 hrs.
2) Stabilize component at room temperature for 1hr.
then measure value.
1) Dwell in temp.: 65 ° C RH90 to 95%RH chamber
without loading for 1000 + ? 48 0 hrs.
2) Stabilize component at room temperature for 1hr.
then measure value.
1) Temp.: 70 ± 3 ° C Voltage: (rated voltage) on 90 min.
off 30 min. Duration: 1000 + ? 48 0 hrs.
2) Stabilize component at room temperature for 1hr.
then measure value.
1) Temp.: 40 ± 2 ° C RH: 90 to 95% Voltage Cycle: on 90
min. (rated voltage) off 30 min. Duration: 1000 + ? 48 0 hrs.
2) Stabilize component at room temperature for 1hr.
then measure value.
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