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参数资料
| 型号： | CY29FCT818TLCC |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | Diagnostic Scan Register |
| 中文描述： | 诊断扫描寄存器 |
| 文件页数： | 3/7页 |
| 文件大小： | 93K |
| 代理商： | CY29FCT818TLCC |
CY29FCT818T
3
Document #: 38-00275-B
Notes:
1.
2.
3.
4.
5.
6.
7.
NA = Not Applicable
Unless otherwise noted, these limits are over the operating free-air temperature range.
Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
T
is the “instant on” case temperature.
Typical values are at V
=5.0V, T
=+25C ambient.
This parameter is specified but not tested.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameters tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
Electrical Characteristics
Over the Operating Range
Parameter
Description
Test Conditions
Min.
Typ.
[5]
Max.
Unit
Capacitance
[8]
Parameter
C
IN
C
OUT
Description
Test Conditions
Typ.
[5]
5
9
Max.
10
12
Unit
pF
pF
Input Capacitance
Output Capacitance
Power Supply Characteristics
Parameter
I
CC
I
CC
Description
Test Conditions
Typ.
[5]
0.2
0.5
Max.
1.5
2.0
Unit
mA
mA
Quiescent Power Supply Current
Quiescent Power Supply Current
(TTL inputs HIGH)
Dynamic Power Supply Current
[9]
V
CC
=Max., V
IN
<
0.2V, V
IN
>
V
CC
–0.2V
V
CC
=Max., V
IN
=3.4V, f
1
=0, Outputs Open
[8]
I
CCD
V
CC
=Max., 50% Duty Cycle, Outputs Open,
One Input Toggling, OE=GND,
V
IN
<
0.2V or V
IN
>
V
CC
–0.2V
V
CC
=Max., 50% Duty Cycle, Outputs Open,
f
0
=10 MHz, One Bit Toggling at f
1
=5 MHz,
OE=GND, V
IN
<
0.2V or V
IN
>
V
CC
–0.2V
V
CC
=Max., 50% Duty Cycle, Outputs Open,
f
0
=10 MHz, One Bit Toggling at f
1
=5 MHz,
OE=GND, V
IN
=3.4V or V
IN
=GND
V
CC
=Max., 50% Duty Cycle, Outputs Open,
f
0
=10 MHz, Eight Bits and Four Controls
Toggling, f
1
=5 MHz, OE=GND,
V
IN
<
0.2V or V
IN
>
V
CC
–0.2V
V
CC
=Max., 50% Duty Cycle, Outputs Open,
f
0
=10 MHz, Eight Bits and Four Controls
Toggling, f
1
=5 MHz, OE=GND,
V
IN
=3.4V or V
IN
=GND
0.25
mA/MHz
I
C
Total Power Supply Current
[10]
5.3
mA
7.3
mA
17.8
[11]
mA
30.8
[11]
mA
Notes:
8.
9.
10. I
C
Per TTL driven input (V
=3.4V); all other inputs at V
or GND.
This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
= I
QUIESCENT
+ I
INPUTS
+ I
I
C
= I
D
N
(f
/2 + f
N
)
I
CC
= Quiescent Current with CMOS input levels
I
CC
= Power Supply Current for a TTL HIGH input (V
IN
=3.4V)
D
H
= Duty Cycle for TTL inputs HIGH
N
T
= Number of TTL inputs at D
I
CCD
= Dynamic Current caused by an input transition pair (HLH or LHL)
f
0
= Clock frequency for registered devices, otherwise zero
f
1
= Input signal frequency
N
= Number of inputs changing at f
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the I
CC
formula. These limits are specified but not tested.
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