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参数资料
| 型号： | CY74FCT163CTSOCG4 |
| 厂商： | Texas Instruments |
| 文件页数： | 8/12页 |
| 文件大小： | 0K |
| 描述： | IC SYNC 4-BIT BIN CNTR 16-SOIC |
| 标准包装： | 40 |
| 系列： | 74FCT |
| 逻辑类型： | 二进制计数器 |
| 方向： | 上 |
| 元件数： | 1 |
| 每个元件的位元数： | 4 |
| 复位： | 同步 |
| 触发器类型： | 正边沿 |
| 电源电压： | 4.75 V ~ 5.25 V |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 16-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 16-SOIC |
| 包装： | 管件 |
CY54FCT163T, CY74FCT163T
4-BIT BINARY COUNTERS
SCCS015A – MAY 1994 – REVISED OCTOBER 2001
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
CY54FCT163T
CY74FCT163T
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
MIN
TYP
MAX
UNIT
VIK
VCC = 4.5 V,
IIN = –18 mA
–0.7
–1.2
V
VIK
VCC = 4.75 V,
IIN = –18 mA
–0.7
–1.2
V
VCC = 4.5 V,
IOH = –12 mA
2.4
3.3
VOH
VCC = 4 75 V
IOH = –32 mA
2
V
VCC = 4.75 V
IOH = –15 mA
2.4
3.3
VOL
VCC = 4.5 V,
IOL = 32 mA
0.3
0.55
V
VOL
VCC = 4.75 V,
IOL = 64 mA
0.3
0.55
V
Vhys
All inputs
0.2
V
II
VCC = 5.5 V,
VIN = VCC
5
A
II
VCC = 5.25 V,
VIN = VCC
5
A
IIH
VCC = 5.5 V,
VIN = 2.7 V
±1
A
IIH
VCC = 5.25 V,
VIN = 2.7 V
±1
A
IIL
VCC = 5.5 V,
VIN = 0.5 V
±1
A
IIL
VCC = 5.25 V,
VIN = 0.5 V
±1
A
I
VCC = 5.5 V,
VOUT = 0 V
–60
–120
–225
mA
IOS
VCC = 5.25 V,
VOUT = 0 V
–60
–120
–225
mA
Ioff
VCC = 0 V,
VOUT = 4.5 V
±1
A
ICC
VCC = 5.5 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
0.1
0.2
mA
ICC
VCC = 5.25 V,
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
0.1
0.2
mA
ICC
VCC = 5.5 V, VIN = 3.4 V§, f1 = 0, Outputs open
0.2
2
mA
ICC
VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open
0.2
2
mA
ICCD
VCC = 5.5 V, Load mode, Outputs open,
One bit switching at 50% duty cycle,
CEP = CET = PE = GND, SR = VCC,
VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
0.06
0.12
mA/
ICCD
VCC = 5.25 V, Load mode, Outputs open,
One bit switching at 50% duty cycle,
CEP = CET = PE = GND, SR = VCC,
VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
0.06
0.12
MHz
Typical values are at VCC = 5 V, TA = 25°C.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus
and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise,
prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In
any sequence of parameter tests, IOS tests should be performed last.
§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
This parameter is derived for use in total power-supply calculations.
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