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| 型号： | DAC5311IDCKRG4 |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | DAC |
| 英文描述： | SERIAL INPUT LOADING, 12 us SETTLING TIME, 8-BIT DAC, PDSO6 |
| 封装： | GREEN, PLASTIC, SC-70, 6 PIN |
| 文件页数： | 27/42页 |
| 文件大小： | 2283K |
| 代理商： | DAC5311IDCKRG4 |
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PARAMETER DEFINITIONS
Full-Scale Error
STATIC PERFORMANCE
Offset Error
Resolution
Zero-Code Error
Least Significant Bit (LSB)
Gain Error
Most Significant Bit (MSB)
Full-Scale Error Drift
Relative Accuracy or Integral Nonlinearity (INL)
Offset Error Drift
Zero-Code Error Drift
Differential Nonlinearity (DNL)
www.ti.com ................................................................................................................................................................................................ SBAS442 – AUGUST 2008
With the increased complexity of many different
specifications listed in product data sheets, this
section summarizes selected specifications related to
Full-scale error is defined as the deviation of the real
digital-to-analog converters.
full-scale output voltage from the ideal output voltage
while the DAC register is loaded with the full-scale
code (0xFFFF). Ideally, the output should be VDD –
1LSB. The full-scale error is expressed in percent of
Static performance parameters are specifications
full-scale range (%FSR).
such as differential nonlinearity (DNL) or integral
nonlinearity (INL). These are dc specifications and
provide information on the accuracy of the DAC. They
are most important in applications where the signal
Offset error is defined as the difference between
changes slowly and accuracy is required.
actual output voltage and the ideal output voltage in
the linear region of the transfer function. This
difference is calculated by using a straight line
defined by two codes (for example, for 16-bit
Generally, the DAC resolution can be expressed in
resolution, codes 485 and 64714). Since the offset
different forms. Specifications such as IEC 60748-4
error is defined by a straight line, it can have a
recognize
the
numerical,
analog,
and
relative
negative or positve value. Offset error is measured in
resolution. The numerical resolution is defined as the
mV.
number of digits in the chosen numbering system
necessary to express the total number of steps of the
transfer characteristic, where a step represents both
a digital input code and the corresponding discrete
Zero-code error is defined as the DAC output voltage,
analogue output value. The most commonly-used
when all '0's are loaded into the DAC register.
definition of resolution provided in data sheets is the
Zero-scale error is a measure of the difference
numerical resolution expressed in bits.
between actual output voltage and ideal output
voltage (0V). It is expressed in mV. It is primarily
caused by offsets in the output amplifier.
The least significant bit (LSB) is defined as the
smallest value in a binary coded system. The value of
the LSB can be calculated by dividing the full-scale
Gain error is defined as the deviation in the slope of
output voltage by 2n, where n is the resolution of the
the real DAC transfer characteristic from the ideal
converter.
transfer function. Gain error is expressed as a
percentage of full-scale range (%FSR).
The most significant bit (MSB) is defined as the
largest value in a binary coded system. The value of
Full-scale error drift is defined as the change in
the MSB can be calculated by dividing the full-scale
full-scale
error
with
a
change
in
temperature.
output voltage by 2. Its value is one-half of full-scale.
Full-scale
error
drift
is
expressed
in
units
of
%FSR/°C.
Relative accuracy or integral nonlinearity (INL) is
defined as the maximum deviation between the real
Offset error drift is defined as the change in offset
transfer function and a straight line passing through
error with a change in temperature. Offset error drift
the endpoints of the ideal DAC transfer function. INL
is expressed in
V/°C.
is measured in LSBs.
Zero-code error drift is defined as the change in
Differential nonlinearity (DNL) is defined as the
zero-code error with a change in temperature.
maximum deviation of the real LSB step from the
Zero-code error drift is expressed in
V/°C.
ideal 1LSB step. Ideally, any two adjacent digital
codes correspond to output analog voltages that are
exactly one LSB apart. If the DNL is within ±1LSB,
the DAC is said to be monotonic.
Copyright 2008, Texas Instruments Incorporated
33
Product Folder Link(s): DAC5311 DAC6311 DAC7311
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相关代理商/技术参数 |
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| DAC5311IDCKRQ1 | 功能描述:数模转换器- DAC Auto Cat 8B Sgl Ch 80uA 1.8-5.5V DAC RoHS:否 制造商:Texas Instruments 转换器数量:1 DAC 输出端数量:1 转换速率:2 MSPs 分辨率:16 bit 接口类型:QSPI, SPI, Serial (3-Wire, Microwire) 稳定时间:1 us 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:SOIC-14 封装:Tube |
| DAC5311IDCKT | 功能描述:数模转换器- DAC 8B Sgl Ch 80uA DAC RoHS:否 制造商:Texas Instruments 转换器数量:1 DAC 输出端数量:1 转换速率:2 MSPs 分辨率:16 bit 接口类型:QSPI, SPI, Serial (3-Wire, Microwire) 稳定时间:1 us 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:SOIC-14 封装:Tube |
| DAC5311IDCKT | 制造商:Texas Instruments 功能描述:; Leaded Process Compatible:Yes; Peak Re 制造商:Texas Instruments 功能描述:IC, DAC, 8BIT, 225KSPS, SC-70-6 |
| DAC5311IDCKTG4 | 功能描述:数模转换器- DAC 8B Sgl Ch DAC w/SPI RoHS:否 制造商:Texas Instruments 转换器数量:1 DAC 输出端数量:1 转换速率:2 MSPs 分辨率:16 bit 接口类型:QSPI, SPI, Serial (3-Wire, Microwire) 稳定时间:1 us 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:SOIC-14 封装:Tube |
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