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参数资料
| 型号： | DS1021S-50 |
| 厂商： | DALLAS SEMICONDUCTOR |
| 元件分类： | Delay Line |
| 英文描述： | SILICON DELAY LINE, TRUE OUTPUT, PDSO16 |
| 封装： | 0.300 INCH, SOIC-16 |
| 文件页数： | 5/9页 |
| 文件大小： | 193K |
| 代理商： | DS1021S-50 |
DS1021
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DALLAS SEMICONDUCTOR TEST CIRCUIT Figure 4
TEST SETUP DESCRIPTION
Figure 4 illustrates the hardware configuration used for measuring the timing parameters of the DS1021.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected to the output. The DS1021 serial and
parallel ports are controlled by interfaces to a central computer. All measurements are fully automated
with each instrument controlled by the computer over an IEEE 488 bus.
TEST CONDITIONS
INPUT:
Ambient Temperature:
25°C ± 3°C
Supply Voltage (VCC):
5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance:
50 ohms max.
Rise and Fall Time:
3.0 ns max.
(measured between 0.6V and 2.4V)
Pulse Width:
500 ns (DS1021–25)
2 s (DS1021–50)
Period:
1 s (DS1021–25)
4 s (DS1021–50)
NOTE: Above conditions are for test only and do not restrict the operation of the device under other data
sheet conditions.
OUTPUT:
Output is loaded with a 74F04. Delay is measured between the 1.5V level of the rising edge of the input
signal and the 1.5V level of the corresponding edge of the output.
DS1021
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相关代理商/技术参数 |
参数描述 |
|---|---|
| DS1021S-50/T&R | 制造商:Maxim Integrated Products 功能描述:IC DEL LN 256TAP 137.5NS 16SOIC |
| DS1021S-50/T&R | 功能描述:延迟线/计时元素 RoHS:否 制造商:Micrel 功能:Active Programmable Delay Line 传播延迟时间:1000 ps 工作温度范围: 封装 / 箱体:QFN-24 封装:Tube |
| DS1021S-50+ | 功能描述:延迟线/计时元素 Programmable 8-Bit .5ns Delay Line RoHS:否 制造商:Micrel 功能:Active Programmable Delay Line 传播延迟时间:1000 ps 工作温度范围: 封装 / 箱体:QFN-24 封装:Tube |
| DS1021S-50+T&R | 制造商:Maxim Integrated Products 功能描述:IC DEL LN 256TAP 137.5NS 16SOIC |
| DS1021S-50+T&R | 功能描述:延迟线/计时元素 RoHS:否 制造商:Micrel 功能:Active Programmable Delay Line 传播延迟时间:1000 ps 工作温度范围: 封装 / 箱体:QFN-24 封装:Tube |
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