参数资料
型号: DS1023S-200+T&R
厂商: Maxim Integrated Products
文件页数: 15/16页
文件大小: 0K
描述: IC DELAY LINE 256TAP 16-SOIC
产品培训模块: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
标准包装: 1,000
标片/步级数: 256
功能: 单发射,可编程
延迟到第一抽头: 16.5ns
接头增量: 2ns
可用的总延迟: 510ns
独立延迟数: 1
电源电压: 4.75 V ~ 5.25 V
工作温度: 0°C ~ 70°C
安装类型: 表面贴装
封装/外壳: 16-SOIC(0.295",7.50mm 宽)
供应商设备封装: 16-SOIC W
包装: 带卷 (TR)
DS1023
8 of 16
DALLAS SEMICONDUCTOR TEST CIRCUIT Figure 8
TEST SETUP DESCRIPTION
Figure 8 illustrates the hardware configuration used for measuring the timing parameters of the DS1023.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected to the output. The DS1023 serial and
parallel ports are controlled by interfaces to a central computer. All measurements are fully automated
with each instrument controlled by the computer over an IEEE 488 bus.
TEST CONDITIONS
INPUT:
Ambient Temperature:
25
°C ± 3°C
Supply Voltage (VCC):
5.0V
± 0.1V
Input Pulse:
High = 3.0V
± 0.1V
Low = 0.0V
± 0.1V
Source Impedance:
50 ohms max.
Rise and Fall Time:
3.0 ns max.
(measured between
0.6V and 2.4V)
Pulse Width:
500 ns
Period:
1
ms
NOTE: Above conditions are for test only and do not restrict the operation of the device under other data
sheet conditions.
OUTPUT:
Output is loaded with a 74F04. Delay is measured between the 1.5V level of the rising edge of the input
signal and the 1.5V level of the corresponding edge of the output.
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