参数资料
型号: DS10BR254TSQX/NOPB
厂商: National Semiconductor
文件页数: 13/16页
文件大小: 0K
描述: IC LVDS REPEAT 1.5GBPS 1:4 40LLP
标准包装: 2,500
类型: 转发器
Tx/Rx类型: LVDS
延迟时间: 440ps
电容 - 输入: 1.7pF
电源电压: 3 V ~ 3.6 V
电流 - 电源: 135mA
安装类型: 表面贴装
封装/外壳: 40-WFQFN 裸露焊盘
供应商设备封装: 40-LLP-EP(6x6)
包装: 带卷 (TR)
其它名称: DS10BR254TSQX
SNLS260D – DECEMBER 2007 – REVISED APRIL 2013
AC Electrical Characteristics
Over recommended operating supply and temperature ranges unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ
Max
Units
LVDS OUTPUT AC SPECIFICATIONS
tPLHD
Differential Propagation Delay Low to
440
650
ps
High(1)
RL = 100
tPHLD
Differential Propagation Delay High to
400
650
ps
Low(1)
tSKD1
Pulse Skew |tPLHD tPHLD|
(1) (2)
40
100
ps
tSKD2
Channel to Channel Skew(1)(3)
40
125
ps
tSKD3
Part to Part Skew(1)(4)
50
200
ps
tLHT
Rise Time(1)
150
300
ps
RL = 100
tHLT
Fall Time(1)
150
300
ps
tON
Any PWDN to Output Active Time
8
20
μs
tOFF
Any PWDN to Output Inactive Time
5
12
ns
tSEL
Select Time
5
12
ns
JITTER PERFORMANCE(1)
tRJ1
VID = 350 mV
135 MHz
0.5
1
ps
VCM = 1.2V
tRJ2
311 MHz
0.5
1
ps
Random Jitter
Clock (RZ)
(RMS Value)(5)
tRJ3
503 MHz
0.5
1
ps
tRJ4
750 MHz
0.5
1
ps
tDJ1
VID = 350 mV
270 Mbps
6
22
ps
VCM = 1.2V
tDJ2
622 Mbps
6
21
ps
Deterministic Jitter
K28.5 (NRZ)
(Peak to Peak Value)(6)
tDJ3
1.0625 Gbps
9
18
ps
tDJ4
1.5 Gbps
9
17
ps
tTJ1
VID = 350 mV
270 Mbps
0.01
0.03
UIP-P
VCM = 1.2V
tTJ2
622 Mbps
0.01
0.03
UIP-P
PRBS-23 (NRZ)
Total Jitter(7)
tTJ3
1.0625 Gbps
0.01
0.04
UIP-P
tTJ4
1.5 Gbps
0.01
0.06
UIP-P
(1)
Specification is specified by characterization and is not tested in production.
(2)
tSKD1, |tPLHD tPHLD|, Pulse Skew, is the magnitude difference in differential propagation delay time between the positive going edge and
the negative going edge of the same channel.
(3)
tSKD2, Channel to Channel Skew, is the difference in propagation delay (tPLHD or tPHLD) among all output channels in Broadcast mode
(any one input to all outputs).
(4)
tSKD3, Part to Part Skew, is defined as the difference between the minimum and maximum differential propagation delays. This
specification applies to devices at the same VCC and within 5°C of each other within the operating temperature range.
(5)
Measured on a clock edge with a histogram and an accumulation of 1500 histogram hits. Input stimulus jitter is subtracted geometrically.
(6)
Tested with a combination of the 1100000101 (K28.5+ character) and 0011111010 (K28.5- character) patterns. Input stimulus jitter is
subtracted algebraically.
(7)
Measured on an eye diagram with a histogram and an accumulation of 3500 histogram hits. Input stimulus jitter is subtracted.
6
Copyright 2007–2013, Texas Instruments Incorporated
Product Folder Links: DS10BR254
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