参数资料
型号: ENH181E1-220
英文描述: Low Noise LDO with Low IQ, High PSRR; Temperature Range: -40°C to 85°C; Package: 5-SC-70 T&R
中文描述: 18.1inch SXGA
文件页数: 8/18页
文件大小: 194K
代理商: ENH181E1-220
Original specifications created by Sharp.
16
Panelview Hillsboro, OR (503) 690-2460
Panelview is a subsidiary of White Electronic Designs Corporation
ENH181E1-220
Panelview
Enhancing the Vision
RELIABLITY TEST ITEMS
No.
Test item
Conditions
1
High temperature storage test
Ta=60°C
240h
2
Low temperature storage test
Ta=25°C
240h
3
High temperature
Ta=40°C ;
95%RH
240h
& high humidity operation test
(No condensation)
4
High temperature operation test
Ta=50°C
240h
(The panel temp. must be less than 60°C)
5
Low temperature operation test
Ta=0°C
240h
6
Vibration test
Waveform : Sine wave
(non operating)Frequency : 10~57Hz/Vibration width (one side)
: 0.075mm
: 58~500Hz/Gravity: 9.8m/s2
Sweep time : 11 minutes
Test period : 3 hours
(1 hour for each direction of X, Y, Z)
7
Shock test
Max. gravity: 490m/s2
(non operating)Pulse width: 11ms, sine wave
Direction: ±X, ±Y, ±Z
once for each direction.
8
Thermal Shock test
Ta= -20°C ~ 60°C ; 5 cycles
Test period : 10 hours (1 hour for each temperature)
9
Altitude
Ta=50°C, 70kPa, 3, 048m (10,000ft), t=24h (Operating)
Ta=50°C, 18.75kpa, 12, 192m (40,000ft), t=24h (Storage)
(Result Evaluation Criteria)
Under the display quality test conditions with normal operation state, there shall be no change
which may affect practical display function.
OTHERS
1) Disassembling the module can cause permanent damage and should be strictly avoided.
2) Image retention may occur when a fixed pattern is displayed for a long period of time.
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