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参数资料
| 型号： | EVAL-AD5062EBZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 5/20页 |
| 文件大小： | 0K |
| 描述： | BOARD EVAL FOR AD5062 |
| 标准包装： | 1 |
| 系列： | nanoDAC™ |
| DAC 的数量： | 1 |
| 位数： | 16 |
| 采样率（每秒）： | 30M |
| 数据接口： | SPI? |
| 设置时间： | 4µs |
| DAC 型： | 电压 |
| 工作温度： | -40°C ~ 85°C |
| 已供物品： | 板 |
| 已用 IC / 零件： | AD5062 |
AD5062
Rev. A | Page 13 of 20
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity (INL)
is a measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer function.
A typical INL vs. code plot is shown in Figure 4.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot is shown in Figure 7.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5062 because the output of the DAC cannot go below 0 V.
This is due to the offset errors in the DAC. Zero-code error is
expressed in mV.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded to the DAC register. Ideally, the output
should be VDD 1 LSB. Full-scale error is expressed in percent
of full-scale range.
Gain Error
This is a measure of the span error of the DAC. It is the devia-
tion in slope of the DAC transfer characteristic from ideal
expressed as a percent of the full-scale range.
Total Unadjusted Error (TUE)
Total unadjusted error is a measure of the output error taking
all the various errors into account. A typical TUE vs. code plot
is shown in Figure 5.
Zero-Code Error Drift
This is a measure of the change in zero-code error with a
change in temperature. It is expressed in μV/°C.
Gain Error Drift
This is a measure of the change in gain error with changes in
temperature. It is expressed in (ppm of full-scale range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
The expanded view in Figure 17 shows the glitch generated
following completion of the calibration routine; Figure 21
zooms in on this glitch.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-s and measured with a full-scale code change
on the data bus; that is, from all 0s to all 1s, and vice versa.
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| EVAL-AD5063EB | 制造商:Analog Devices 功能描述:Evaluation Board For 14-/16-Bit, Serial Input, Vout NanoDACs 制造商:Analog Devices 功能描述:EVAL BD FOR AD506X DAC 14-/16BIT, SERL INPUT - Bulk |
| EVAL-AD5063EBZ | 功能描述:BOARD EVAL FOR AD5063 RoHS:是 类别:编程器，开发系统 >> 评估板 - 数模转换器 (DAC) 系列:* 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- DAC 的数量:4 位数:12 采样率（每秒）:- 数据接口:串行，SPI? 设置时间:3µs DAC 型:电流/电压 工作温度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5064-1EBZ | 功能描述:BOARD EVALUATION FOR AD5064-1 RoHS:是 类别:编程器，开发系统 >> 评估板 - 数模转换器 (DAC) 系列:nanoDAC™ 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- DAC 的数量:4 位数:12 采样率（每秒）:- 数据接口:串行，SPI? 设置时间:3µs DAC 型:电流/电压 工作温度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5064EBZ | 功能描述:BOARD EVAL FOR AD5064 RoHS:是 类别:编程器，开发系统 >> 评估板 - 数模转换器 (DAC) 系列:nanoDAC™ 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- DAC 的数量:4 位数:12 采样率（每秒）:- 数据接口:串行，SPI? 设置时间:3µs DAC 型:电流/电压 工作温度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581 |
| EVAL-AD5065EBZ | 制造商:AD 制造商全称:Analog Devices 功能描述:Fully Accurate 12-/14-/16-Bit VOUT DAC SPI Interface 2.7 V to 5.5 V in a TSSOP |
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