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参数资料
| 型号： | EVAL-AD5821EBZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 3/17页 |
| 文件大小： | 0K |
| 描述： | BOARD EVALUATION FOR AD5821 |
| 产品培训模块： | DAC Architectures |
| 标准包装： | 1 |
| DAC 的数量： | 1 |
| 位数： | 10 |
| 采样率（每秒）： | 400k |
| 数据接口： | I²C |
| 设置时间： | 250µs |
| DAC 型： | 电流 |
| 工作温度： | -30°C ~ 80°C |
| 已供物品： | 板，缆线，CD |
| 已用 IC / 零件： | AD5821 |
| 相关产品： | AD5821BCBZ-REEL7DKR-ND - IC DAC 10BIT CURRENTSINK 9WLCSP AD5821BCBZ-REEL7CT-ND - IC DAC 10BIT CURRENTSINK 9WLCSP AD5821BCBZ-REEL7TR-ND - IC DAC 10BIT CURRENTSINK 9WLCSP AD5821BCBZ-REEL-ND - IC DAC 10BIT CURRENTSINK 9WLCSP |
AD5821
Rev. 0 | Page 10 of 16
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy or integral nonlinearity is a
measurement of the maximum deviation, in LSB, from a
straight line passing through the endpoints of the DAC transfer
function. A typical INL vs. code plot is shown in Figure 5.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot is shown in Figure 6.
Zero-Code Error
Zero-code error is a measurement of the output error when zero
code (0x0000) is loaded to the DAC register. Ideally, the output
is 0 mA. The zero-code error is always positive in the AD5821
because the output of the DAC cannot go below 0 mA. This is
due to a combination of the offset errors in the DAC and output
amplifier. Zero-code error is expressed in milliamperes (mA).
Gain Error
Gain error is a measurement of the span error of the DAC. It is
the deviation in slope of the DAC transfer characteristic from
the ideal, expressed as a percent of the full-scale range.
Gain Error Drift
Gain error drift is a measurement of the change in gain error
with changes in temperature. It is expressed in LSB/°C.
Digital-to-Analog Glitch Impulse
This is the impulse injected into the analog output when the
input code in the DAC register changes state. It is normally
specified as the area of the glitch in nanoamperes per second
(nA-s) and is measured when the digital input code is changed
by 1 LSB at the major carry transition.
Digital Feedthrough
Digital feedthrough is a measurement of the impulse injected
into the analog output of the DAC from the digital inputs of the
DAC, but it is measured when the DAC output is not updated.
It is specified in nanoamperes per second (nA-s) and measured
with a full-scale code change on the data bus, that is, from all 0s
to all 1s and vice versa.
Offset Error
Offset error is a measurement of the difference between ISINK
(actual) and IOUT (ideal) in the linear region of the transfer
function, expressed in milliamperes (mA). Offset error is
measured on the AD5821 with Code 16 loaded into the DAC
register.
Offset Error Drift
Offset error drift is a measurement of the change in offset error
with a change in temperature. It is expressed in microvolts per
degree Celsius (μV/°C).
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相关代理商/技术参数 |
参数描述 |
|---|---|
| EVAL-AD5821EBZ1 | 制造商:AD 制造商全称:Analog Devices 功能描述:120 mA, Current Sinking, 10-Bit, I2C DAC |
| EVAL-AD5930EB | 制造商:Analog Devices 功能描述:EVALUATION CONTROL BOARD I.C. - Bulk |
| EVAL-AD5930EBZ | 功能描述:BOARD EVAL FOR AD5930 RoHS:是 类别:编程器，开发系统 >> 评估演示板和套件 系列:- 标准包装:1 系列:- 主要目的:电信，线路接口单元（LIU） 嵌入式:- 已用 IC / 零件:IDT82V2081 主要属性:T1/J1/E1 LIU 次要属性:- 已供物品:板，电源，线缆，CD 其它名称:82EBV2081 |
| EVAL-AD5932EB | 制造商:Analog Devices 功能描述:EVALUATION BOARD - Bulk |
| EVAL-AD5932EBZ | 功能描述:BOARD EVAL FOR AD5932 RoHS:是 类别:编程器，开发系统 >> 评估演示板和套件 系列:- 标准包装:1 系列:- 主要目的:电信，线路接口单元（LIU） 嵌入式:- 已用 IC / 零件:IDT82V2081 主要属性:T1/J1/E1 LIU 次要属性:- 已供物品:板，电源，线缆，CD 其它名称:82EBV2081 |
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