- 您现在的位置：买卖IC网 > PDF目录17293 > EVAL-AD7747EBZ (Analog Devices Inc)BOARD EVAL FOR AD7747 PDF资料下载
参数资料
| 型号： | EVAL-AD7747EBZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 17/28页 |
| 文件大小： | 0K |
| 描述： | BOARD EVAL FOR AD7747 |
| 标准包装： | 1 |
| 传感器类型： | 触摸，电容式 |
| 接口： | I²C |
| 电源电压： | 2.7 V ~ 5.25 V |
| 嵌入式： | 否 |
| 已供物品： | 板，缆线，CD |
| 已用 IC / 零件： | AD7747 |
| 产品目录页面： | 781 (CN2011-ZH PDF) |
| 相关产品： | AD7747ARUZ-REEL7-ND - IC CONV CAP TO DIG 24BIT 16TSSOP AD7747ARUZ-REEL-ND - IC CONV CAP TO DIG 24BIT 16TSSOP AD7747ARUZ-ND - IC CONV 24BIT CAP-DGTL 16-TSSOP |
第1页第2页第3页第4页第5页第6页第7页第8页第9页第10页第11页第12页第13页第14页第15页第16页当前第17页第18页第19页第20页第21页第22页第23页第24页第25页第26页第27页第28页
AD7747
Rev. 0 | Page 24 of 28
CAPACITIVE SYSTEM OFFSET CALIBRATION
The capacitive offset is dominated by the parasitic offset in the
application, such as the initial capacitance of the sensor, any
parasitic capacitance of tracks on the board, and the capacitance
of any other connections between the sensor and the CDC.
Therefore, the AD7747 is not factory calibrated for capacitive
offset. It is the user’s responsibility to calibrate the system
capacitance offset in the application.
Any offset in the capacitance input larger than ±1 pF should
first be removed using the on-chip CAPDACs. The small offset
within ±1 pF can then be removed by using the capacitance
offset calibration register.
One method of adjusting the offset is to connect a zero-scale
capacitance to the input and execute the capacitance offset
calibration mode. The calibration sets the midpoint of the
±8.192 pF range (that is, Output Code 0x800000) to that
zero-scale input.
Another method is to calculate and write the offset calibration
register value; the LSB value is 31.25 aF (8.192 pF/217).
The offset calibration register is reloaded by the default value at
power-on or after reset. Therefore, if the offset calibration is not
repeated after each system power-up, the calibration coefficient
value should be stored by the host controller and reloaded as
part of the AD7747 setup.
INTERNAL TEMPERATURE SENSOR
DIGITAL
FILTER
AND
SCALING
24-BIT Σ-Δ
MODULATOR
CLOCK
GENERATOR
INTERNAL TEMPERATURE SENSOR
0
54
69
-0
26
VOLTAGE
REFERENCE
DATA
IN × I
ΔVBE
VDD
Figure 36. Internal Temperature Sensor
The temperature sensing method used in the AD7747 is to
measure a difference in ΔVBE voltage of a transistor operated at
temperature is linear and can be expressed as
)
ln(
)
(
N
q
KT
n
V
f
BE
×
=
Δ
where:
K is Boltzmann’s constant (1.38 × 1023).
T is the absolute temperature in Kelvin.
q is the charge on the electron (1.6 × 1019 coulombs).
N is the ratio of the two currents.
nf is the ideality factor of the thermal diode.
The AD7747 uses an on-chip transistor to measure the
temperature of the silicon chip inside the package. The Σ-Δ
ADC converts the ΔVBE to digital; the data are scaled using
factory calibration coefficients. Thus, the output code is
proportional to temperature.
()
4096
2048
=
°
Code
C
e
Temperatur
The AD7747 has a low power consumption resulting in only a
small effect due to the part self-heating (less than 0.5°C at
VDD = 5 V).
If the capacitive sensor can be considered to be at the same
temperature as the AD7747 chip, the internal temperature
sensor can be used as a system temperature sensor. That means
the complete system temperature drift compensation can be
based on the AD7747 internal temperature sensor without need
for any additional external components. See
Figure 17 in the
Typical Performance Characteristics section.
EXTERNAL TEMPERATURE SENSOR
DIGITAL
FILTER
AND
SCALING
24-BIT Σ-Δ
MODULATOR
CLOCK
GENERATOR
EXTERNAL
TEMPERATURE
SENSOR
0
5
469
-02
7
VOLTAGE
REFERENCE
DATA
I ... N × I
ΔVBE
VDD
VIN(–)
VIN(+)
RS2
RS1
2N3906
Figure 37. Transistor as an External Temperature Sensor
The AD7747 provides the option of using an external transistor
as a temperature sensor in the system. The ΔVBE method, which
is similar to the internal temperature sensor method, is used.
However, it is modified to compensate for the serial resistance
of connections to the sensor. Total serial resistance (RS1 + RS2 in
Figure 37) up to 100 Ω is compensated. The VIN() pin must
be grounded for proper external temperature sensor operation.
The AD7747 is factory calibrated for Transistor 2N3906 with
the ideality factor nf = 1.008.
See Figure 18 in the Typical Performance Characteristics section.
相关PDF资料 |
PDF描述 |
|---|---|
| 0210490723 | CABLE JUMPER 1.25MM .030M 5POS |
| ECC16DJCN-S1136 | CONN EDGECARD 32PS .100 PRESSFIT |
| RSC05DRTN | CONN EDGECARD 10POS DIP .100 SLD |
| GCM15DSXS | CONN EDGECARD 30POS DIP .156 SLD |
| RMC05DRTN | CONN EDGECARD 10POS DIP .100 SLD |
相关代理商/技术参数 |
参数描述 |
|---|---|
| EVAL-AD7751EB | 制造商:AD 制造商全称:Analog Devices 功能描述:Energy Metering IC With On-Chip Fault Detection |
| EVAL-AD7755EB | 制造商:AD 制造商全称:Analog Devices 功能描述:Energy Metering IC with Pulse Output |
| EVAL-AD7760EB | 制造商:Analog Devices 功能描述:EVALUATION BOARD ((NS)) |
| EVAL-AD7760EBZ | 制造商:Analog Devices 功能描述:EVALUATION BOARD FOR AD7760/AD7762/AD7763 USING EVAL-CED1Z 制造商:Analog Devices 功能描述:EVALUATION BOARD - Bulk |
| EVAL-AD7760EDZ | 功能描述:BOARD EVAL CONTROL AD7760 RoHS:是 类别:编程器，开发系统 >> 评估板 - 模数转换器 (ADC) 系列:- 产品培训模块:Obsolescence Mitigation Program 标准包装:1 系列:- ADC 的数量:1 位数:12 采样率（每秒）:94.4k 数据接口:USB 输入范围:±VREF/2 在以下条件下的电源（标准）:- 工作温度:-40°C ~ 85°C 已用 IC / 零件:MAX11645 已供物品:板，软件 |
发布紧急采购，3分钟左右您将得到回复。