参数资料
型号: EX256-TQG100A
厂商: Microsemi SoC
文件页数: 30/48页
文件大小: 0K
描述: IC FPGA ANTIFUSE 12K 100-TQFP
标准包装: 90
系列: EX
逻辑元件/单元数: 512
输入/输出数: 81
门数: 12000
电源电压: 2.3 V ~ 2.7 V
安装类型: 表面贴装
工作温度: -40°C ~ 125°C
封装/外壳: 100-LQFP
供应商设备封装: 100-TQFP(14x14)
TMS
Test Mode Select
The TMS pin controls the use of the IEEE 1149.1 Boundary scan pins (TCK, TDI, TDO, TRST). In flexible
mode when the TMS pin is set LOW, the TCK, TDI, and TDO pins are boundary scan pins (refer to
Table 1-4 on page 1-10). Once the boundary scan pins are in test mode, they will remain in that mode
until the internal boundary scan state machine reaches the “logic reset” state. At this point, the boundary
scan pins will be released and will function as regular I/O pins. The “logic reset” state is reached five TCK
cycles after the TMS pin is set HIGH. In dedicated test mode, TMS functions as specified in the IEEE
1149.1 specifications.
TRST, I/O
Boundary Scan Reset Pin
Once it is configured as the JTAG Reset pin, the TRST pin functions as an active-low input to
asynchronously initialize or reset the boundary scan circuit. The TRST pin is equipped with an internal
pull-up resistor. This pin functions as an I/O when the Reserve JTAG Reset Pin is not selected in the
Designer software.
VCCI
Supply Voltage
Supply voltage for I/Os.
VCCA
Supply Voltage
Supply voltage for Array.
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