参数资料
型号: FIN1028M
厂商: Fairchild Semiconductor
文件页数: 5/10页
文件大小: 0K
描述: RECEIVER 3.3V LVDS HS 8-SOIC
产品变化通告: Mold Compound Change 12/Sept/2008
标准包装: 95
类型: 接收器
驱动器/接收器数: 0/2
规程: LVDS
电源电压: 3 V ~ 3.6 V
安装类型: 表面贴装
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SOICN
包装: 管件
其它名称: FIN1028M-ND
FIN1028MFS
2001 Fairchild Semiconductor Corporation
www.fairchildsemi.com
FIN1028 Rev. 1.0.2
4
FIN
1028
3.3V
LVD
S
2-
B
it
H
igh-
Speed
D
if
fe
rent
ial
R
eciever
DC Electrical Characteristics
Typical values are at TA=25°C and with VCC=3.3V. Over-supply voltage and operating temperature ranges, unless
otherwise noted.
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Units
VTH
Differential Input Threshold HIGH
Figure 2, Table 1
100
mV
VTL
Differential Input Threshold LOW
Figure 2, Table 1
-100
mV
IIN
Input Current
VIN=0V or VCC
±20
A
II(OFF)
Power-off Input Current
VCC=0V, VIN=0V or 3.6V
±20
A
IOH=-100A
VCC-0.2
VOH
Output HIGH Voltage
IOH=-8mA
2.4
V
IOL=100A
0.2
VOL
Output LOW Voltage
IOL=8mA
0.5
V
VIK
Input Clamp Voltage
IIK=-18mA
-1.5
V
ICC
Power Supply Current
RIN+=1V and RIN-=1.4V or
RIN+=1.4V and RIN-=1V
9
mA
CIN
Input Capacitance
4
pF
COUT
Output Capacitance
6
pF
DC Electrical Characteristics
Typical values are at TA=25°C and with VCC=3.3V. Over-supply voltage and operating temperature ranges, unless
otherwise noted.
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Units
tPLH
Differential Propagation Delay,
LOW-to-HIGH
0.9
2.5
ns
tPHL
Differential Propagation Delay,
HIGH-to-LOW
0.9
2.5
ns
tTLH
Output Rise Time (20% to 80%)
0.5
ns
tTHL
Output Fall Time (80% to 20%)
0.5
ns
tSK(P)
Pulse Skew
t
PLH - tPHL
0.4
ns
tSK(LH), tSK(HL)
Channel-to-Channel Skew
(2)
0.3
ns
tSK(PP)
Part-to-Part Skew
(3)
V
ID=400mV,
CL=10pF
Figure 2, Figure 3
1.0
ns
Notes:
2.
tSK(LH), tSK(HL) is the skew between specified outputs of a single device when the outputs have identical loads and
are switching in the same direction.
3.
tSK(PP) is the magnitude of the difference in propagation delay times between any specified terminals of two
devices switching in the same direction (either LOW-to-HIGH or HIGH-to-LOW) when both devices operate with
the same supply voltage, same temperature, and have identical test circuits.
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