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参数资料
| 型号： | HCS573DMSR |
| 厂商： | INTERSIL CORP |
| 元件分类： | 通用总线功能 |
| 英文描述： | Low-Voltage, Dual Hot-Swap Controllers with Independent On/Off Control |
| 中文描述： | HC/UH SERIES, 8-BIT DRIVER, TRUE OUTPUT, CDIP20 |
| 封装： | METAL SEALED, SIDE BRAZED, CERAMIC, DIP-20 |
| 文件页数： | 6/10页 |
| 文件大小： | 144K |
| 代理商： | HCS573DMSR |
329
Specifications HCS573MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11,
(Note 2)
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTES:
1. Alternate Group A testing in accordance with method 5005 of MIL-STD-883 may be exercised.
2. Table 5 parameters only.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
12 - 19
1 - 11
-
20
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
12 - 19
10
-
1 - 9, 11, 20
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
1, 10
12 - 19
20
11
2 - 9
NOTES:
1. Each pin except VCC and GND will have a resistor of 10k
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 680
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
12 - 19
10
1 - 9, 11, 20
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518771
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PDF描述 |
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| HCS573K | Low-Voltage, Dual Hot-Swap Controllers with Independent On/Off Control |
| HCS573MS | Low-Voltage, Dual Hot-Swap Controllers with Independent On/Off Control |
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相关代理商/技术参数 |
参数描述 |
|---|---|
| HCS573HMSR | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:Radiation Hardened Octal Transparent Latch, Three-State |
| HCS573K | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:Radiation Hardened Octal Transparent Latch, Three-State |
| HCS573KMSR | 制造商:Intersil Corporation 功能描述:LATCH TRANSPARENT 3-ST OCTAL D-TYPE 20PIN CFLATPACK - Bulk |
| HCS573MS | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:Radiation Hardened Octal Transparent Latch, Three-State |
| HCS-5C | 制造商:TE Connectivity 功能描述: |
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