参数资料
型号: HCTS00K
厂商: Intersil Corporation
英文描述: Radiation Hardened Quad 2-Input NAND Gate
中文描述: 辐射加固四2输入与非门
文件页数: 5/9页
文件大小: 49K
代理商: HCTS00K
374
Specifications HCTS00MS
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONDITIONS (Note 1)
3, 6, 8, 11
1, 2, 4, 5, 7, 9, 10, 12,
13
-
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
3, 6, 8, 11
7
-
1, 2, 4, 5, 9, 10, 12,
13, 14
-
-
DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)
-
7
3, 6, 8, 11
14
1, 2, 4, 5, 9, 10,
12, 13
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% static burn-in.
2. Each pin except VCC and GND will have a resistor of 1K
±
5% dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
3, 6, 8, 11
7
1, 2, 4, 5, 9, 10, 12, 13, 14
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5%. Group E, Subgroup 2,
sample size is 4 dice/wafer, 0 failures.
Spec Number
518774
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