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| 型号： | ICL3225ECAZ |
| 厂商： | Intersil |
| 文件页数： | 6/20页 |
| 文件大小： | 0K |
| 描述： | IC 2DRVR/2RCVR RS232 3V 20-SSOP |
| 标准包装： | 66 |
| 类型： | 收发器 |
| 驱动器/接收器数： | 2/2 |
| 规程： | RS232 |
| 电源电压： | 3 V ~ 5.5 V |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 20-SSOP（0.209"，5.30mm 宽） |
| 供应商设备封装： | 20-SSOP |
| 包装： | 管件 |
14
FN4900.9
February 27, 2006
Human Body Model (HBM) Testing
As the name implies, this test method emulates the ESD
event delivered to an IC during human handling. The tester
delivers the charge through a 1.5k
current limiting resistor,
making the test less severe than the IEC61000 test which
utilizes a 330
limiting resistor. The HBM method
determines an ICs ability to withstand the ESD transients
typically present during handling and manufacturing. Due to
the random nature of these events, each pin is tested with
respect to all other pins. The RS-232 pins on “E” family
devices can withstand HBM ESD events to
±15kV.
IEC61000-4-2 Testing
The IEC61000 test method applies to finished equipment,
rather than to an individual IC. Therefore, the pins most likely
to suffer an ESD event are those that are exposed to the
outside world (the RS-232 pins in this case), and the IC is
tested in its typical application configuration (power applied)
rather than testing each pin-to-pin combination. The lower
current limiting resistor coupled with the larger charge
storage capacitor yields a test that is much more severe than
the HBM test. The extra ESD protection built into this
device’s RS-232 pins allows the design of equipment
meeting level 4 criteria without the need for additional board
level protection on the RS-232 port.
AIR-GAP DISCHARGE TEST METHOD
For this test method, a charged probe tip moves toward the
IC pin until the voltage arcs to it. The current waveform
delivered to the IC pin depends on approach speed,
humidity, temperature, etc., so it is difficult to obtain
repeatable results. The “E” device RS-232 pins withstand
±15kV air-gap discharges.
CONTACT DISCHARGE TEST METHOD
During the contact discharge test, the probe contacts the
tested pin before the probe tip is energized, thereby
eliminating the variables associated with the air-gap
discharge. The result is a more repeatable and predictable
test, but equipment limits prevent testing devices at voltages
higher than
±8kV. All “E” family devices survive ±8kV contact
discharges on the RS-232 pins.
Typical Performance Curves VCC = 3.3V, TA = 25°C
FIGURE 15. TRANSMITTER OUTPUT VOLTAGE vs LOAD
CAPACITANCE
FIGURE 16. SLEW RATE vs LOAD CAPACITANCE
-6
-4
-2
0
2
4
6
1000
2000
3000
4000
5000
0
LOAD CAPACITANCE (pF)
TRAN
S
M
ITTER
OUTPUT
V
O
L
T
A
G
E
(V)
1 TRANSMITTER AT 1Mbps
VOUT+
VOUT-
OTHER TRANSMITTERS AT 30kbps
LOAD CAPACITANCE (pF)
SL
EW
R
A
TE
(V
/
s)
0
1000
2000
3000
4000
5000
0
10
30
50
110
-SLEW
+SLEW
70
90
ICL3225E, ICL3227E, ICL3245E
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相关代理商/技术参数 |
参数描述 |
|---|---|
| ICL3225ECAZ-T | 功能描述:RS-232接口集成电路 RS232 3V 2D/2R 15KV 1MBPS E-DWN20SSOP CM RoHS:否 制造商:Exar 数据速率:52 Mbps 工作电源电压:5 V 电源电流:300 mA 工作温度范围:- 40 C to + 85 C 安装风格:SMD/SMT 封装 / 箱体:LQFP-100 封装: |
| ICL3225ECP | 功能描述:IC 2DRVR/2RCVR RS232 3V 20-DIP RoHS:否 类别:集成电路 (IC) >> 接口 - 驱动器，接收器，收发器 系列:- 标准包装:1,000 系列:- 类型:收发器 驱动器/接收器数:2/2 规程:RS232 电源电压:3 V ~ 5.5 V 安装类型:表面贴装 封装/外壳:16-SOIC（0.295"，7.50mm 宽） 供应商设备封装:16-SOIC 包装:带卷 (TR) |
| ICL3225ECPZ | 功能描述:RS-232接口集成电路 RS232 3V 2D/2R 15KV 1MBPS E-DWN RoHS:否 制造商:Exar 数据速率:52 Mbps 工作电源电压:5 V 电源电流:300 mA 工作温度范围:- 40 C to + 85 C 安装风格:SMD/SMT 封装 / 箱体:LQFP-100 封装: |
| ICL3225EIA | 功能描述:RS-232接口集成电路 3-5.5V TXRX ESD RoHS:否 制造商:Exar 数据速率:52 Mbps 工作电源电压:5 V 电源电流:300 mA 工作温度范围:- 40 C to + 85 C 安装风格:SMD/SMT 封装 / 箱体:LQFP-100 封装: |
| ICL3225EIA-T | 功能描述:IC 2DRVR/2RCVR RS232 3V 20-SSOP RoHS:否 类别:集成电路 (IC) >> 接口 - 驱动器，接收器，收发器 系列:- 标准包装:1,000 系列:- 类型:收发器 驱动器/接收器数:2/2 规程:RS232 电源电压:3 V ~ 5.5 V 安装类型:表面贴装 封装/外壳:16-SOIC（0.295"，7.50mm 宽） 供应商设备封装:16-SOIC 包装:带卷 (TR) |
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