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参数资料
| 型号： | ICSSSTU32864YHT |
| 厂商： | INTEGRATED DEVICE TECHNOLOGY INC |
| 元件分类： | 锁存器 |
| 英文描述： | SSTU SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, PBGA96 |
| 封装： | MO-205CC, LFBGA-96 |
| 文件页数： | 11/11页 |
| 文件大小： | 110K |
| 代理商： | ICSSSTU32864YHT |
9
ICSSSTU32864
0727C—04/15/04
Notes: 1. CL incluces probe and jig capacitance.
2. IDD tested with clock and data inputs held at VDD or GND, and Io = 0mA.
3. All input pulses are supplied by generators having the following chareacteristics: PRR
≤10 MHz,
Zo=50
, input slew rate = 1 V/ns ±20% (unless otherwise specified).
4. The outputs are measured one at a time with one transition per measurement.
5. VREF = VDD/2
6. VIH = VREF + 250 mV (ac voltage levels) for differential inputs. VIH = VDD for LVCMOS input.
7. VIL = VREF - 250 mV (ac voltage levels) for differential inputs. VIL = GND for LVCMOS input.
8. VID = 600 mV
9. tPLH and tPHL are the same as tPDM.
Figure 6 — Parameter M easurement I nfor mation (VDD = 1.8 V ± 0.1 V)
RL = 1000
CL = 30 pF
(see Note 1)
LOAD CIRCUIT
tw
VICR
Inpu t
VIH
VIL
VOLTAGE WAVEFORMS – PULSE DURATION
VREF
Inpu t
tsu
th
VID
VICR
VOLTAGE WAVEFORMS – SETUP AND HOLD TIMES
VICR
VID
VICR
Output
VOL
VOH
VTT
tPHL
tPLH
VOLTAGE WAVEFORMS – PROPAGATION DELAY TIMES
tRPHL
VOL
VOH
VIL
VIH
Output
VOLTAGE WAVEFORMS – PROPAGATION DELAY TIMES
VDD/2
VTT
tact
tinact
LVCMOS
Input
RST#
VOLTAGE AND CURRENT WAVEFORMS
IDD
(see
Note 2)
90%
10%
INPUTS ACTIVE AND INACTIVE TIMES
0 V
VDD
Test Point
VDD/2
VCMOS
Inp ut
RST#
TL=350ps, 50
DUT
CK#
Out
TL
td = 350ps
=50
CK Inputs
VID
CK
RL = 100
CK
Test Point
RL = 1000
VDD
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