参数资料
型号: IDT7007S25PF8
厂商: IDT, Integrated Device Technology Inc
文件页数: 11/21页
文件大小: 0K
描述: IC SRAM 256KBIT 25NS 80TQFP
标准包装: 750
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 256K (32K x 8)
速度: 25ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
封装/外壳: 80-LQFP
供应商设备封装: 80-TQFP(14x14)
包装: 带卷 (TR)
其它名称: 7007S25PF8
IDT7007S/L
High-Speed 32K x 8 Dual-Port Static RAM
Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 1, R/ W Controlled Timing (1,5,8)
t WC
ADDRESS
OE
t AW
t HZ
(7)
CE or SEM
(9)
t AS (6)
t WP (2)
t WR
(3)
R/ W
t WZ (7)
t OW
DATA OUT
(4)
t DW
t DH
(4)
DATA IN
2940 drw 09
Timing Waveform of Write Cycle No. 2, CE Controlled Timing (1,5)
t WC
ADDRESS
t AW
CE or SEM
(9)
t AS
R/ W
(6)
t EW (2)
t DW
t WR (3)
t DH
DATA IN
2940 drw 10
NOTES:
1. R/ W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (t EW or t WP ) of a LOW CE and a LOW R/ W for memory array writing cycle.
3. t WR is measured from the earlier of CE or R/ W (or SEM or R/ W ) going HIGH to the end of write cycle.
4. During this period, the I/O pins are in the output state and input signals must not be applied.
5. If the CE or SEM LOW transition occurs simultaneously with or after the R/ W LOW transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal is asserted last, CE or R/ W .
7. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load (Figure
2).
8. If OE is LOW during R/ W controlled write cycle, the write pulse width must be the larger of t WP or (t WZ + t DW ) to allow the I/O drivers to turn off and data to be
placed on the bus for the required t DW . If OE is HIGH during an R/ W controlled write cycle, this requirement does not apply and the write pulse can be as short as
the specified t WP .
9. To access RAM, CE = V IL and SEM = V IH . To access semaphore, CE = V IH and SEM = V IL . t EW must be met for either condition.
11
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