参数资料
型号: IDT7015S25J8
厂商: IDT, Integrated Device Technology Inc
文件页数: 5/20页
文件大小: 0K
描述: IC SRAM 72KBIT 25NS 68PLCC
标准包装: 250
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 72K(8K x 9)
速度: 25ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
封装/外壳: 68-LCC(J 形引线)
供应商设备封装: 68-PLCC(24x24)
包装: 带卷 (TR)
其它名称: 7015S25J8
IDT7015S/L
Capacitance
High-Speed 8K x 9 Dual-Port Static RAM
(1)
(T A = +25°C, f = 1.0mhz, for TQFP Package)
Military, Industrial and Commercial Temperature Ranges
Symbol
C IN
C OUT
Parameter
Input Capacitance
Output Capacitance
Conditions (2)
V IN = 3dV
V OUT = 3dV
Max.
9
10
Unit
pF
pF
2954 tbl 07
NOTES:
1. This parameter is determined by device characteristics but is not
production tested.
2. 3dV references the interpolated capacitance when the input and
output signals switch from 0V to 3V or from 3V to 0V .
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (V CC = 5.0V ± 10%)
7015S
7015L
Input Leakage Current
Symbol
|I LI |
|I LO |
V OL
V OH
Parameter
(1)
Output Leakage Current
Output Low Voltage
Output High Voltage
Test Conditions
V CC = 5.5V, V IN = 0V to V CC
CE = V IH , V OUT = 0V to V CC
I OL = +4mA
I OH = -4mA
Min.
___
___
___
2.4
Max.
10
10
0.4
___
Min.
___
___
___
2.4
Max.
5
5
0.4
___
Unit
μA
μA
V
V
NOTE:
1. At Vcc < 2.0V, Input leakages are undefined.
Output Loads and
AC Test Conditions
Input Pulse Levels
GND to 3.0V
2954 tbl 08
Input Rise/Fall Times
(1)
3ns Max.
Input Timing Reference Levels
Output Reference Levels
Output Load
1.5V
1.5V
Figures 1 and 2
2954 tbl 09
DATA OUT
BUSY
5V
893 ?
DATA OUT
5V
893 ?
INT
347 ?
30pF
347 ?
5pF *
2954 drw 05
Figure 1. AC Output Test Load
5
6.42
2954 drw 06
Figure 2. Output Test Load
(For t LZ , t HZ , t WZ , t OW )
*Including scope and jig.
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