参数资料
型号: IDT70V25S20PF8
厂商: IDT, Integrated Device Technology Inc
文件页数: 7/25页
文件大小: 0K
描述: IC SRAM 128KBIT 20NS 100TQFP
标准包装: 750
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 128K(8K x 16)
速度: 20ns
接口: 并联
电源电压: 3 V ~ 3.6 V
工作温度: 0°C ~ 70°C
封装/外壳: 100-LQFP
供应商设备封装: 100-TQFP(14x14)
包装: 带卷 (TR)
其它名称: 70V25S20PF8
IDT70V35/34S/L (IDT70V25/24S/L)
High-Speed 3.3V 8/4K x 18 (8/4K x 16) Dual-Port Static RAM
Industrial and Commercial Temperature Ranges
Absolute Maximum Ratings
Symbol Rating Commercial
(1)
& Industrial
Unit
Maximum Operating Temperature
and Supply Voltage (1)
Grade Ambient GND V DD
V TERM (2)
Terminal Voltage
-0.5 to +4.6
V
Temperature
with Respect
to GND
Commercial
0 O C to +70 O C
0V
3.3V + 0.3V
T BIAS
Temperature
-55 to +125
o
C
Industrial
-40 O C to +85 O C
0V
3.3V + 0.3V
Under Bias
T STG
T JN
Storage
Temperature
Junction Temperature
-65 to +150
+150
o
o
C
C
NOTE:
1. This is the parameter T A . This is the "instant on" case temperature.
5624 tbl 05
I OUT
DC Output
50
mA
Current
5624 tbl 04
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only and
Recommended DC Operating
Conditions
functional operation of the device at these or any other conditions above those
Symbol
Parameter
Min.
Typ.
Max.
Unit
indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect
reliability.
2. V TERM must not exceed V DD + 0.3V for more than 25% of the cycle time or 10ns
maximum, and is limited to < 20mA for the period of V TERM > V DD + 0.3V.
Capacitance (1) (T A = +25°C, f = 1.0MHz)
V DD
V SS
V IH
V IL
Supply Voltage
Ground
Input High Voltage
Input Low Voltage
3.0
0
2.0
-0.3 (1)
3.3
0
____
____
3.6
0
V DD +0.3 (2)
0.8
V
V
V
V
5624 tbl 06
C OUT
Symbol
C IN
(2)
Parameter
Input Capacitance
Output Capacitance
Conditions
V IN = 0V
V OUT = 0V
Max.
9
10
Unit
pF
pF
NOTES:
1. V IL > -1.5V for pulse width less than 10ns.
2. V TERM must not exceed V DD + 0.3V.
NOTES:
5624 tbl 07
1. This parameter is determined by device characterization but is not production
tested.
2. C OUT also references C I/O .
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (V DD = 3.3V ± 0.3V)
70V35/34/25/24S
70V35/34/25/24L
Input Leakage Current
Output Leakage Currentt
Symbol
|I LI |
|I LO |
V OL
V OH
Parameter
(1)
(1)
Output Low Voltage
Output High Voltage
Test Conditions
V DD = 3.6V, V IN = 0V to V DD
CE = V IH , V OUT = 0V to V DD
I OL = +4mA
I OH = -4mA
Min.
___
___
___
2.4
Max.
10
10
0.4
___
Min.
___
___
___
2.4
Max.
5
5
0.4
___
Unit
μA
μA
V
V
NOTE:
1. At V DD < 2.0V leakages are undefined.
7
6.42
5624 tbl 08
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