参数资料
型号: IDT70V9079S9PF8
厂商: IDT, Integrated Device Technology Inc
文件页数: 4/19页
文件大小: 0K
描述: IC SRAM 256KBIT 9NS 100TQFP
标准包装: 750
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,同步
存储容量: 256K (32K x 8)
速度: 9ns
接口: 并联
电源电压: 3 V ~ 3.6 V
工作温度: 0°C ~ 70°C
封装/外壳: 100-LQFP
供应商设备封装: 100-TQFP(14x14)
包装: 带卷 (TR)
其它名称: 70V9079S9PF8
IDT70V9089/79S/L
High Speed 3.3V 64/32K x 8 Synchronous Dual-Port Static RAM
Recommended Operating
Temperature and Supply Voltage (1)
Industrial and Commercial Temperature Ranges
Recommended DC Operating
Conditions
Grade
Ambient
Temperature
GND
V DD
Symbol
Parameter
Min.
Typ.
Max.
Unit
V DD
Supply Voltage
3.0
3.3
3.6
V
Commercial
0 O C to +70 O C
0V
3.3V + 0.3V
V SS
Ground
0
0
0
V
Industrial
-40 O C to +85 O C
0V
3.3V + 0.3V
V IH
Input High Voltage
2.2
____
V DD + 0.3V
(1)
V
-0.3
NOTES:
3750 tbl 04
V IL
Input Low Voltage
(2)
____
0.8
V
1. This is the parameter T A . This is the "instant on" case temperature.
Absolute Maximum Ratings (1)
NOTES:
1. V TERM must not exceed V DD +0.3V.
2. V IL > -1.5V for pulse width less than 10ns.
Capacitance (T A = +25°C, f = 1.0MH z )
3750 tbl 05
Symbol
Rating
Commercial
Unit
Symbol
Parameter (1)
Conditions (2)
Max.
Unit
& Industrial
C IN
Input Capacitance
V IN = 3dV
9
pF
C OUT
V TERM (2)
Terminal Voltage
with Respect
-0.5 to +4.6
V
(3)
Output Capacitance
V OUT = 3dV
10
pF
to GND
NOTES:
3750 tbl 07
T BIAS
Temperature
-55 to +125
o
C
1. These parameters are determined by device characterization, but are not
Under Bias
production tested.
2. 3dV references the interpolated capacitance when the input and output switch
T STG
T JN
Storage Temperature
Junction Temperature
-65 to +150
+150
o
o
C
C
from 0V to 3V or from 3V to 0V.
3. C OUT also references C I/O .
I OUT
DC Output Current
50
mA
3750 tbl 06
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. V TERM must not exceed V DD +0.3V for more than 25% of the cycle time or 10ns
maximum, and is limited to < 20mA for the period of V TERM > V DD + 0.3V.
3. Ambient Temperature Under Bias. Chip Deselected.
6.42
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