参数资料
型号: IDT71016S15YG8
厂商: IDT, Integrated Device Technology Inc
文件页数: 7/9页
文件大小: 0K
描述: IC SRAM 1MBIT 15NS 44SOJ
标准包装: 500
格式 - 存储器: RAM
存储器类型: SRAM - 异步
存储容量: 1M (64K x 16)
速度: 15ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
封装/外壳: 44-BSOJ
供应商设备封装: 44-SOJ
包装: 带卷 (TR)
其它名称: 71016S15YG8
IDT71016, CMOS Static RAM
1 Meg (64K x 16-bit)
Commercial and Industrial Temperature Ranges
Timing Waveform of Write Cycle No. 2 ( CS Controlled Timing) (1,4)
t WC
ADDRESS
t AW
CS
t AS
t CW (2)
t BW
BHE , BLE
WE
DATA OUT
t WP
t DW
t WR
t DH
,
DATA IN
DATA IN VALID
3210 drw 9
Timing Waveform of Write Cycle No. 3 ( BHE , BLE Controlled Timing) (1,4)
t WC
ADDRESS
t AW
CS
t AS
t CW
(2)
t BW
BHE , BLE
WE
DATA OUT
t WP
t DW
t WR
t DH
DATA IN
DATA IN VALID
3210 drw 10
,
NOTES:
1. A write occurs during the overlap of a LOW CS , LOW BHE or BLE , and a LOW WE .
2. OE is continuously HIGH. If during a WE controlled write cycle OE is LOW, t WP must be greater than or equal to t WHZ + t DW to allow the I/O drivers to turn off and
data to be placed on the bus for the required t DW . If OE is HIGH during a WE controlled write cycle, this requirement does not apply and the
minimum write pulse is as short as the specified t WP .
3. During this period, I/O pins are in the output state, and input signals must not be applied.
4. If the CS LOW or BHE and BLE LOW transition occurs simultaneously with or after the WE LOW transition, the outputs remain in a high-impedance state.
5. Transition is measured ±200mV from steady state.
7
6.42
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