参数资料
型号: IDT71256SA25PZGI
厂商: IDT, Integrated Device Technology Inc
文件页数: 6/8页
文件大小: 0K
描述: IC SRAM 256KBIT 25NS 28TSOP
标准包装: 234
格式 - 存储器: RAM
存储器类型: SRAM - 异步
存储容量: 256K (32K x 8)
速度: 25ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: -40°C ~ 85°C
封装/外壳: 28-TSSOP(0.465",11.8mm 宽)
供应商设备封装: 28-TSOP
包装: 托盘
其它名称: 71256SA25PZGI
IDT71256SA
CMOS Static RAM 256K (32K x 8-Bit)
Commercial and Industrial Temperature Ranges
Timing Waveform of Write Cycle No. 1 ( WE Controlled Timing) (1,2,4)
t WC
ADDRESS
t AW
CS
WE
t AS
t WP (2)
t WR
t WHZ (5)
t OW (5)
t CHZ (5)
DATA OUT
(3)
HIGH IMPEDANCE
t DW
t DH
(3)
DATA IN
DATA IN VALID
2948 drw 07
,
Timing Waveform of Write Cycle No. 2 ( CS Controlled Timing) (1,4)
t WC
ADDRESS
t AW
CS
WE
t AS
t CW
t DW
t WR
t DH
DATA IN
DATA IN VALID
2948 drw 08
,
NOTES:
1. A write occurs during the overlap of a LOW CS and a LOW WE .
2. OE is continuously HIGH. If during a WE controlled write cycle OE is LOW, t WP must be greater than or equal to t WHZ + t DW to allow the I/O drivers to turn off and data
to be placed on the bus for the required t DW . If OE is HIGH during a WE controlled write cycle, this requirement does not apply and the minimum write pulse is as
short as the specified t WP .
3. During this period, I/O pins are in the output state, and input signals must not be applied.
4. If the CS LOW transition occurs simultaneously with or after the WE LOW transition, the outputs remain in a high-impedance state.
5. Transition is measured ±200mV from steady state.
6
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