参数资料
型号: IDT7140LA55C
厂商: IDT, Integrated Device Technology Inc
文件页数: 12/21页
文件大小: 0K
描述: IC SRAM 8KBIT 55NS 48DIP
标准包装: 8
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,异步
存储容量: 8K (1K x 8)
速度: 55ns
接口: 并联
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
封装/外壳: 48-DIP(0.600",15.24mm)
供应商设备封装: 48-SIDE BRAZED
包装: 管件
其它名称: 7140LA55C
IDT7130SA/LA and IDT7140SA/LA
High-Speed 1K x 8 Dual-Port Static SRAM
Military, Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature Supply Voltage Range (5)
7130X20 (2)
7140X20 (2)
Com'l Only
7130X25
7140X25
Com'l, Ind
& Military
7130X35
7140X35
Com'l
& Military
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Unit
WRITE CYCLE
t WC
t EW
t AW
t AS
t WP
t WR
t DW
Write Cycle Time (3)
Chip Enable to End-of-Write
Address Valid to End-of-Write
Address Set-up Time
Write Pulse Width (4)
Write Recovery Time
Data Valid to End-of-Write
20
15
15
0
15
0
10
____
____
____
____
____
____
____
25
20
20
0
15
0
12
____
____
____
____
____
____
____
35
30
30
0
25
0
15
____
____
____
____
____
____
____
ns
ns
ns
ns
ns
ns
ns
t HZ
Output High-Z Time
(1)
____
10
____
10
____
15
ns
Write Enable to Output in High-Z
t DH
t WZ
t OW
Data Hold Time
(1)
Output Active from End-of-Write (1)
0
____
0
____
10
____
0
____
0
____
10
____
0
____
0
____
15
____
ns
ns
ns
2689 tbl 10a
7130X55
7140X55
Com'l, Ind
& Military
7130X100
7140X100
Com'l, Ind
& Military
Symbol
Parameter
Min.
Max.
Min.
Max.
Unit
WRITE CYCLE
Write Pulse Width
Write Enable to Output in High-Z
t WC
t EW
t AW
t AS
t WP
t WR
t DW
t HZ
t DH
t WZ
Write Cycle Time (3)
Chip Enable to End-of-Write
Address Valid to End-of-Write
Address Set-up Time
(4)
Write Recovery Time
Data Valid to End-of-Write
Output High-Z Time (1)
Data Hold Time
(1)
55
40
40
0
30
0
20
____
0
____
____
____
____
____
____
____
____
25
____
25
100
90
90
0
55
0
40
____
0
____
____
____
____
____
____
____
____
40
____
40
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
t OW
Output Active from End-of-Write
(1)
0
____
0
____
ns
NOTES:
2689 tbl 10b
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2). This parameter is guaranteed by device characterization but
is not production tested.
2. PLCC, TQFP and STQFP packages only.
3. For MASTER/SLAVE combination, t WC = t BAA + t WP , since R/ W = V IL must occur after t BAA.
4. If OE is LOW during a R/ W controlled write cycle, the write pulse width must be the larger of t WP or (t WZ + t DW ) to allow the I/O drivers to turn off data
to be placed on the bus for the required t DW . If OE is HIGH during a R/W controlled write cycle, this requirement does not apply and the write pulse
can be as short as the specified t WP .
5. 'X' in part numbers indicates power rating (SA or LA).
12
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