参数资料
型号: IDT82V2044EPFG8
厂商: IDT, Integrated Device Technology Inc
文件页数: 51/73页
文件大小: 0K
描述: IC LINE INTERFC UNIT 4CH 128TQFP
标准包装: 1
类型: 线路接口装置(LIU)
规程: E1
电源电压: 3.13 V ~ 3.47 V
安装类型: 表面贴装
封装/外壳: 128-LQFP
供应商设备封装: 128-TQFP(14x20)
包装: 标准包装
其它名称: 800-1863-6
55
INDUSTRIAL
TEMPERATURE RANGES
QUAD CHANNEL T1/E1/J1 SHORT HAUL LINE INTERFACE UNIT
Figure-22 JTAG State Diagram
Pause-IR
The pause state allows the test controller to temporarily halt the shifting of data through the instruction register. The test data register
selected by the current instruction retains its previous value and the instruction does not change during this state. The controller remains in
this state as long as TMS is low. When TMS goes high and a rising edge is applied to TCK, the controller moves to the Exit2-IR state.
Exit2-IR
This is a temporary state. While in this state, if TMS is held high, a rising edge applied to TCK causes the controller to enter the Update-IR
state, which terminates the scanning process. If TMS is held low and a rising edge is applied to TCK, the controller enters the Shift-IR state.
The test data register selected by the current instruction retains its previous value and the instruction does not change during this state.
Update-IR
The instruction shifted into the instruction register is latched into the parallel output from the shift-register path on the falling edge of TCK.
When the new instruction has been latched, it becomes the current instruction. The test data registers selected by the current instruction
retain their previous value.
Table-54 TAP Controller State Description (Continued)
STATE
DESCRIPTION
Test-logic Reset
Run Test/Idle
Select-DR
Select-IR
Capture-DR
Capture-IR
Shift-DR
Shift-IR
Exit1-DR
Exit1-IR
Pause-DR
Pause-IR
Exit2-DR
Exit2-IR
Update-DR
Update-IR
1
0
1
00
0
1
0
1
0
1
0
1
0
1
0
1
0
1
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