参数资料
型号: IDTQS74FCT2374AT
厂商: Integrated Device Technology, Inc.
英文描述: HIGH-SPEED CMOS BUS INTERFACE 8-BIT REGISTER
中文描述: 高速CMOS总线接口8位寄存器
文件页数: 3/6页
文件大小: 88K
代理商: IDTQS74FCT2374AT
3
IDTQS74FCT2374T/AT/CT
HIGH-SPEED CMOS BUS INTERFACE 8-BIT REGISTER
INDUSTRIAL TEMPERATURE RANGE
Symbol
V
IH
V
IL
V
T
I
IH
I
IL
I
OZ
I
OR
V
IC
V
OH
V
OL
R
OUT
(3)
Parameter
Input HIGH Level
Input LOW Level
Input Hysteresis
Input HIGH Current
Input LOW Current
Off-State Output Current (Hi-Z)
Current Drive
Input Clamp Voltage
Output HIGH Voltage
Output LOW Voltage
Output Resistance
Test Conditions
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
TLH
- V
THL
for all inputs
V
CC
= Max.
Min.
2
Typ.
(1)
0.2
Max.
0.8
±
5
Unit
V
V
V
μA
0
V
IN
V
CC
V
CC
= Max
V
CC
= Max., V
OUT
= 2.0V
(2)
V
CC
= Mn, I
IN
= -18mA , T
A
= 25°C
(2)
V
CC
= Mn.
V
CC
= Mn.
V
CC
= Mn.
0
V
IN
V
CC
50
2.4
15
–0.7
21
±
5
–1.2
0.5
35
μA
mA
V
V
V
I
OH
= -15mA
I
OL
= 12mA
I
OH
= 12mA
DC ELECTRICAL CHARACTERISTICS OV ER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= –40°C to +85°C, V
CC
= 5.0V ±5%
NOTES:
1. Typical values are at V
CC
= 5.0V, T
A
= 25°C.
2. This parameter is measured at characterization but not tested.
3. R
OUT
changed on March 8, 2002. See rear page for more information.
POWER SUPPLY CHARACTERISTICS
Following Conditions Apply Unless Otherwise Specified:
Industrial:
T
A
= -40°C to +85°C, V
CC
= 5.0V ± 5%
Symbol
I
CC
Parameter
Test Conditions
(1)
V
CC
= Max.
freq = 0
0V
V
IN
0.2V or
V
CC
- 0.2V
V
IN
Vcc
V
CC
= Max.
V
IN
= 3.4V
(2)
freq = 0
V
CC
= Max.
Outputs Open and Enabled
One Bit Toggling
50% Duty Cycle
Other inputs at GND or Vcc
(3,4)
Min.
Max.
1.5
Unit
mA
Quiescent Power Supply Current
I
CC
Supply Current per Input TTL Inputs HIGH
2
mA
I
CCD
Supply Current per Input per MHz
0.25
mA/MHz
NOTES:
1. For conditions shown as Mn. or Max., use the appropriate values specified under DC Electrical Characteristics.
2. Per TLL driven input (V
IN
= 3.4V).
3. For flip-flops, I
CCD
is measured by switching one of the data input pins so that the output changes every clock cycle. This is a measurement of device power consumption
only and does not include power to drive load capacitance or tester capacitance.
4. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
I
CC
D
H
N
T
+ I
CCD
(f
CP
/2 + f
i
N
i
)
I
CC
= Quiescent Current
I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamc Current Caused by an Output Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
i
= Input Frequency
N
i
= Number of Inputs at f
i
All currents are in mlliamps and all frequencies are in megahertz.
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