www.irf.com
3
Pre-Irradiation
IRHM7Z60
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation
Parameter
Min Max Min Max
BV
DSS
Drain-to-Source Breakdown Voltage 30 — 30 — V V
GS
= 12V, I
D
= 1.0mA
V
GS(th)
Gate Threshold Voltage
2.0
I
GSS
Gate-to-Source Leakage Forward
— 100
I
GSS
Gate-to-Source Leakage Reverse
— -100
I
DSS
Zero Gate Voltage Drain Current
—
R
DS(on)
Static Drain-to-Source
— 0.014
On-State Resistance (TO-3)
R
DS(on)
Static Drain-to-Source
— 0.014 — 0.035
V
GS
= 12V, I
D
=15A
On-State Resistance (TO-254AA)
V
SD
Diode Forward Voltage
— 1.5 —
1. Part number IRHM7Z60
2. Part numbers IRHM3Z60, IRHM4Z60 and IRHM8Z60
100K Rads(Si)
1
300 - 1000K Rads (Si)
2
Units
Test Conditions
4.0
1.25 4.5
—
— -100
— 50 μA
— 0.035
V
GS
= 12V, I
D
=15A
V
GS
= V
DS
, I
D
= 1.0mA
100 nA
V
GS
= 20V
V
GS
= -20 V
V
DS
=24V, V
GS
=0V
25
1.5 V
V
GS
= 0V, IS = 35A
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.
The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
Fig a.
Single Event Effect, Safe Operating Area
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
For footnotes refer to the last page
Table 2. Single Event Effect Safe Operating Area
n
o
I
T
c
g
E
m
L
)
2
m
(
V
e
M
y
)
g
V
r
e
e
n
M
(
E
e
)
g
n
m
a
μ
(
R
)
V
(
S
D
V
V
0
=
S
G
V
@
V
5
-
=
S
G
V
@
V
0
1
-
=
S
G
V
@
V
5
1
-
=
S
G
V
@
V
0
2
-
=
S
G
V
@
r
B
8
.
6
3
5
0
3
9
3
0
3
0
3
0
3
5
2
0
2
I
9
.
9
5
5
4
3
8
.
2
3
5
2
5
2
0
2
5
1
0
1
U
A
3
.
0
8
3
1
3
5
.
6
2
5
.
2
2
5
.
2
2
5
1
0
1
_
0
5
10
15
20
25
30
35
0
-5
-10
-15
-20
VGS
V
Br
I
AU