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参数资料
| 型号： | IRM-V538N7/TR1 |
| 厂商： | EVERLIGHT ELECTRONICS CO LTD |
| 元件分类： | 光电元器件 |
| 英文描述： | LOGIC OUTPUT PHOTO DETECTOR |
| 封装： | 5.30 X 3.80 MM, 2.65 MM HEIGHT, ROHS COMPLIANT, MINIATURE, PLASTIC, SMD, 3 PIN |
| 文件页数： | 11/12页 |
| 文件大小： | 281K |
| 代理商： | IRM-V538N7/TR1 |
EVERLIGHT ELECTRONICS CO.,LTD.
Everlight Electronics Co., Ltd.
http:\\www.everlight.com
Rev
3
Page: 8 of 12
Device No
：DMO-538-398
Prepared date
：11 -24-2006
Prepared by
：Cindy Lin
IRM-V538N7/TR1
Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level：90%
LTPD：10%
Reflow Terms:
JEDEC Level 4 Specification
Drying; Temp.:125℃ 24hrs
Moisture 30℃ / 60% RH 96hrs
Reflow Temp.: 260℃±5℃
10sec, 3 times
Note:
1. Not sooner than 15 minutes and not longer than 4 hours after removal from the
temperature/humidity chamber.
2. The time between reflow shall be 5 minutes minimum and 60 minutes maximum.
Test Items
Test Conditions
Failure Judgement
Criteria
Samples(n)
Defective(c)
Temperature cycle
1 cycle：-25℃
+85℃
(30min)(5min)(30min)
300 cycle test
n=76,c=0
High temperature test
Temp：+85℃
Vcc：5V
1000hrs
n=76,c=0
Low temperature
storage
Temp：-40℃
1000hrs
n=76,c=0
High temperature
High humidity
Ta：85℃，RH：85%
1000hrs
L0≦ L×0.8
L45≦ L×0.8
L: Lower
specification limit
*Icc : Operate
Current (mA)
Variation≦±20%:
n=76,c=0
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