参数资料
| 型号： | ISL21400USB-EVALZ |
| 厂商： | Intersil |
| 文件页数： | 6/17页 |
| 文件大小： | 0K |
| 描述： | EVAL BOARD FOR ISL21400 |
| 标准包装： | 1 |
| 系列： | * |
ISL21400
Serial Interface Specification for SCL, SDA, A0, A1, A2 Unless Otherwise Noted. (Continued)
TYP
SYMBOL
t F
Cb
PARAMETER
SDA and SCL Fall Time
Capacitive Loading of SDA or SCL
TEST CONDITIONS
From 70% to 30% of V CC
(Note 7)
Total on-chip and off-chip
MIN
20 + 0.1 x Cb
10
(Note 2)
MAX
250
400
UNITS
ns
pF
(Note 7)
Rpu
SDA and SCL Bus Pull-up Resistor
Maximum is determined by
1
k Ω
Off-chip
t R and t F
For Cb = 400pF, max is
about 2k Ω ~2.5k Ω
For Cb = 40pF, max is about
15k Ω ~20k Ω
I LO
Output Leakage Current (SDA only) V OUT = GND to V CC
1
μA
V IL
V IH
A1, A0, SHDN, SDA, and SCL Input
Buffer LOW Voltage
A1, A0, SHDN, SDA, and SCL Input
Buffer HIGH Voltage
-0.3
V CC x 0.7
V CC x 0.3
V CC
V
V
V OL
C L
SDA Output Buffer LOW Voltage
Capacitive Loading of SDA or SCL
I OL = 100μA (Note 7), at
3mA sink
Total on-chip and off-chip
(Note 7)
0
10
0.4
400
V
pF
EEPROM Endurance
1,000,000
Cycles
EEPROM Retention
Temperature T ≤ +55°C
50
Years
t WC
(Note 18)
Non-Volatile Write Cycle Time
12
20
ms
V OUT = A V ? ? V REF ? ---------- + K ( T – T 0 ) -------------------------------- ? , n = 0 to 255, m = 0 to 255, K = -2.1mV/C(typ), T0 = +25 ° C
? ?
V OUT ( Tmin ) – V OUT ( Tmax )
Tmin – Tmax
V OUT ( TE ) = ------------------------------------------------------------------------------------------------------------- x100%
? V OUT ( Tmin ) – V OUT ( Tmax ) ? ? V OUT ( Tmin ) – V OUT ( Tmax ) ?
TS4 = ? -------------------------------------------------------------------------------- ? – ? -------------------------------------------------------------------------------- ? ÷ 255
?
?
?
m = 0 ?
( Tmin – Tmax ) ( Tmin – Tmax )
NOTES:
5. Equation 1 governs the output voltage and is stated as follows:
? n ( 2 ? m ) – 255 ?
255 255
6. Typical values are for T A = +25°C and V CC = 5.5V.
7. This parameter is not 100% tested.
8. Cb = total capacitance of one bus line in pF.
9. t WC is the time from a valid stop condition at the end of a write sequence to the end of the self-timed internal nonvolatile write cycle. It is the
minimum cycle time to be allowed for any nonvolatile write by the user.
10. Over the specified temperature range. Temperature slope (TS) is measured by the box method whereby the change in V OUT is divided by the
temperature range; in this case, -40°C to +85°C = +125°C. TS 1 , TS 2 , TS 3 =
TS = --------------------------------------------------------------------------------
11. Given by PSRR (dB) = 20 * log 10 ( Δ Vout/ Δ V CC ) at DC.
12. Test +25°C and +85°C only.
13. Total error of Equation 1 @ A V = 1, K = -2.1mV/°C, V REF = 1.20V, m = 255, n = 255 to 0, V CC = 3.0V.
V OUT ( measured ) – V OUT ( Equation1 )
V OUT ( Equation1 )
14. Over the specified temperature range. Temperature slope (TS) is measured by the box method whereby the change in V OUT is divided by the
temperature range. Incremental TS is the temperature slope at m = 255 minus the temperature slope at m = 0 divided by 255 with A V = 1, n = 255
m = 255
6
FN8091.3
March 31, 2011
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