参数资料
型号: ISL54056
厂商: Intersil Corporation
英文描述: Ultra Low ON-Resistance, +1.65V to +4.5V, Single Supply, Quad SPDT (Dual DPDT) Analog Switch(超低导通电阻, +1.65V到+4.5V, 单电源, 四路单刀双掷(双路单刀双掷)模拟开关)
中文描述: 超低电阻,从1.65V至4.5V,单电源,四路单刀双掷(双DPDT)模拟开关(超低导通电阻,从1.65V到4.5V时,单电源,四路单刀双掷(双路单刀双掷)模拟开关)
文件页数: 7/12页
文件大小: 281K
代理商: ISL54056
7
FN6357.4
August 15, 2007
Detailed Description
The ISL54056 is a bidirectional, quad single pole/double
throw (SPDT) analog switch that offers precise switching
capability from a single 1.65V to 4.5V supply with low
ON-resistance (0.39
Ω
) and high speed operation
(t
ON
= 30ns, t
OFF
= 16ns). The device is especially well
suited for portable battery powered equipment due to its low
operating supply voltage (1.65V), low power consumption
(6.3μW max), low leakage currents (165nA max), and the tiny
μTQFN package. The ultra low ON-resistance and
r
ON
flatness provide very low insertion loss and distortion to
applications that require signal reproduction.
External V+ Series Resistor
For improved ESD and latch-up immunity, Intersil
recommends adding a 100
Ω
resistor in series with the V+
power supply pin of the ISL54056
IC (see Figure 8).
During an overvoltage transient event, such as occurs during
system level IEC 61000 ESD testing, substrate currents can
be generated in the IC that can trigger parasitic SCR
structures to turn ON, creating a low impedance path from
the V+ power supply to ground. This will result in a
significant amount of current flow in the IC, which can
potentially create a latch-up state or permanently damage
the IC. The external V+ resistor limits the current during this
over-stress situation and has been found to prevent latch-up
or destructive damage for many overvoltage transient
events.
Under normal operation the sub-microamp I
DD
current of the
IC produces an insignificant voltage drop across the 100
Ω
series resistor resulting in no impact to switch operation or
performance.
FIGURE 4. OFF ISOLATION TEST CIRCUIT
FIGURE 5. r
ON
TEST CIRCUIT
FIGURE 6. CROSSTALK TEST CIRCUIT
FIGURE 7. CAPACITANCE TEST CIRCUIT
Test Circuits and Waveforms
(Continued)
ANALYZER
R
L
SIGNAL
GENERATOR
V+
C
0V OR V+
NO OR NC
COM
IN
GND
V+
C
0V OR V+
NO OR NC
COM
IN
GND
V
NX
V
1
r
ON
= V
1
/100mA
100mA
0V OR V+
ANALYZER
V+
C
NO OR NC
SIGNAL
GENERATOR
R
L
GND
IN
1
COM
50
Ω
NC
COM
NC OR NO
V+
C
GND
NO OR NC
COM
IN
IMPEDANCE
ANALYZER
0V OR V+
ISL54056
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