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参数资料
| 型号： | KA317MTU |
| 厂商： | Fairchild Semiconductor |
| 文件页数： | 2/8页 |
| 文件大小： | 0K |
| 描述： | IC REG LDO ADJ .5A TO220 |
| 产品变化通告： | Heatsink Pkg Change 09/Oct/2007 |
| 标准包装： | 50 |
| 稳压器拓扑结构： | 正，可调式 |
| 输出电压： | 1.2 V ~ 37 V |
| 输入电压： | 最高 40 V |
| 稳压器数量： | 1 |
| 电流 - 输出： | 500mA |
| 工作温度： | 0°C ~ 125°C |
| 安装类型： | 通孔 |
| 封装/外壳： | TO-220-3 |
| 供应商设备封装： | TO-220-3 |
| 包装： | 管件 |
KA317M
Absolute Maximum Ratings
Parameter
Input Output Voltage Differential
Power Dissipation
Thermal Resistance Junction-Air
D-PAK (Note1,2)
Operating Junction Temperature Range
Storage Temperature Range
Symbol
V I - V O
P D
R θ JA
T j
T STG
Value
40
Internally limited
100
0 ~ +125
-65 ~+125
Unit
V
W
° C/W
° C
° C
Electrical Characteristics
(V I -V O =5V, I O = 0.1A, 0 ° C ≤ T J ≤ + 125 ° C, P DMAX = 7.5W, unless otherwise specified)
Parameter
Line Regulation (Note3)
Load Regulation (Note3)
Adjustment Pin Current
Adjustment Pin Current
Change
Reference Voltage
Temperature Stability
Minimum Load Current to
Maintain Regulation
Symbol
Rline
Rload
I ADJ
? I ADJ
V REF
ST T
I L(MIN)
Conditions
T A = +25 ° C, 3V ≤ V I ? V O ≤ 40V
3V ≤ V I ? V O ≤ 40V
T A =+ 25 ° C, 10mA ≤ I O ≤ 0.5A
V O ≤ 5V
V O ≥ 5V
10mA ≤ I O ≤ 0.5A
V O ≤ 5V
V O ≥ 5V
-
3V ≤ V I - V O ≤ 40V
10mA ≤ I O ≤ 0.5A, P D < P DMAX
3V < V I - V O < 40V
10mA ≤ I O ≤ 0.5A, P D < P DMAX
-
V I - V O = 40V
Min.
-
-
-
-
-
-
1.20
-
-
Typ.
0.01
0.02
5
0.1
20
0.3
50
0.2
1.25
0.7
3.5
Max.
0.04
0.07
25
0.5
70
1.5
100
5
1.30
-
10
Unit
%/ V
mV
%/ V O
mV
%/ V O
uA
uA
V
%/ V O
mA
Maximum Output Current I O(MAX)
V I - V O ≤ 15V, P D < P DMAX
V I - V O = 40V
P D < P DMAX , T A =+ 25 ° C
0.5
0.15
0.9
0.25
-
-
A
RMS Noise, % of V OUT
e N
T A = +25 ° C, 10Hz < f < 10KHz
-
0.003
-
%/ V O
V O = 10V, f = 120Hz
Ripple Rejection
RR
without C ADJ
65
-
dB
C ADJ = 10uF (Note4)
66
80
Long-Term Stability
ST
T J =+ 125 ° C, 1000Hours
-
0.3
1
%/1000Hrs
Note :
1. Thermal resistance test board
Size: 76.2mm * 114.3mm * 1.6mm(1S0P)
JEDEC standard: JESD51-3, JESD51-7
2. Assume no ambient airflow.
3. Load and Line regulation are specified at constant junction temperature. Change in V O due to heating effects must be taken
into account separately. Pulse testing with low duty cycle is used.
4. C ADJ , when used, is connected between the adjustment pin and ground.
2
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