参数资料
型号: KAF-31600
厂商: KODAK IMAGE SENSOR SOLUTIONS
元件分类: CCD Image Sensor
英文描述: IMAGE SENSOR-CCD, 6496(H) X 4872(V) PIXEL, RECTANGULAR, THROUGH HOLE MOUNT
封装: CERAMIC, DIP-60
文件页数: 7/32页
文件大小: 1739K
代理商: KAF-31600
DEFECT DEFINITIONS
Defect Operational Conditions
All defect tests performed at T=20°C, tint = 250ms and treadout = 850ms
Defect Specifications
Classification
Points
Clusters
Columns
Includes dead
columns
Standard Quality (SQ)
<4,000
<50
<20
yes
Point Defects
A pixel that deviates by more than 9mV above
neighboring
pixels
under
non-illuminated
conditions
-- OR --
A pixel that deviates by more than 7% above or
11% below neighboring pixels under illuminated
conditions
Cluster Defect
A grouping of not more than 10 adjacent point
defects
Cluster defects are separated by no less than 4
good pixels in any direction
Column Defect
A grouping of more than 10 point defects along a
single column
-- OR --
A column that deviates by more than 0.9 mV
above or below neighboring columns under non-
illuminated conditions
-- OR --
A column that deviates by more than 1.5% above
or below neighboring columns under illuminated
conditions
Column defects are separated by no less than 4
good columns. No multiple column defects
(double or more) will be permitted.
Column and cluster defects are separated by at
least 4 good columns in the x direction.
Dead Columns
A column that deviates by more than 50% below
neighboring columns under illuminated conditions
Saturated Columns
A column that deviates by more than 100mV
above
neighboring
columns
under
non-
illuminated conditions. No saturated columns
are allowed
Eastman Kodak Company, 2005
www.kodak.com/go/imagers
Revision 2.0 MTD/PS-0860 p15
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