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| 型号： | KITMPR03XEVM |
| 厂商： | Freescale Semiconductor |
| 文件页数： | 17/33页 |
| 文件大小： | 0K |
| 描述： | KIT EVAL FOR MPR03X |
| 产品培训模块： | MPR03x - Low-Power Proximity Sensors |
| 视频文件： | KITMPR03XEVM |
| 标准包装： | 1 |
| 传感器类型： | 触摸，电容式 |
| 接口： | I²C |
| 电源电压： | 1.71 V ~ 2.75 V |
| 嵌入式： | 是，其它 |
| 已供物品： | 4 个板，线缆，CD，样品 IC |
| 已用 IC / 零件： | MPR031 |
| 产品目录页面： | 2808 (CN2011-ZH PDF) |
| 相关产品： | MPR031EPR2DKR-ND - IC CTLR TOUCH SENSOR 8-DFN MPR031EPR2CT-ND - IC CTLR TOUCH SENSOR 8-DFN MPR031EPR2TR-ND - IC CTLR TOUCH SENSOR 8-DFN |
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MPR03X
Sensors
24
Freescale Semiconductor
Appendix A
Electrical Characteristics
A.1
Introduction
This section contains electrical and timing specifications.
A.2
Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in Table 19 may affect device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section. This device contains circuitry protecting against damage due to high static
voltage or electrical fields; however, it is advised that normal precautions be taken to avoid application of any voltages higher
than maximum-rated voltages to this high-impedance circuit.
A.3
ESD and Latch-up Protection Characteristics
Normal handling precautions should be used to avoid exposure to static discharge.
Qualification tests are performed to ensure that these devices can withstand exposure to reasonable levels of static without
suffering any permanent damage. During the device qualification ESD stresses were performed for the Human Body Model
(HBM), the Machine Model (MM) and the Charge Device Model (CDM).
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete
DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot
temperature, unless specified otherwise in the device specification.
Table 19. Absolute Maximum Ratings - Voltage (with respect to VSS)
Rating
Symbol
Value
Unit
Supply Voltage
VDD
-0.3 to +2.9
V
Input Voltage
SCL, SDA, IRQ
VIN
VSS - 0.3 to VDD + 0.3
V
Operating Temperature Range
TSG
-40 to +85
°C
Storage Temperature Range
TSG
-40 to +125
°C
Table 20. ESD and Latch-up Test Conditions
Rating
Symbol
Value
Unit
Human Body Model (HBM)
VESD
±4000
V
Machine Model (MM)
VESD
±200
V
Charge Device Model (CDM)
VESD
±500
V
Latch-up current at TA = 85°C
ILATCH
±100
mA
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