参数资料
型号: LC72722
厂商: SANYO SEMICONDUCTOR CO LTD
元件分类: 消费家电
英文描述: SPECIALTY CONSUMER CIRCUIT, PDIP24
封装: SDIP-24
文件页数: 13/15页
文件大小: 114K
代理商: LC72722
No. 5602-7/15
LC72722, 72722M, 72722PM
CCB Input Data Format
Caution: The bits labeled with an asterisk must be set to 0.
1. Synchronization protection (forward protection) method setting (4 bits): FS0 to FS3
FS3 = 0: If offset words in the correct order could not be detected continuously during the number of blocks specified
by FS0 to FS2, take that to be a lost synchronization state.
FS3 = 1: If blocks with uncorrectable errors were received consecutively during the number of blocks specified by
FS0 to FS2, take that to be a lost synchronization state.
Initial value: FS0 = 0, FS1 = 1, FS2 = 0, FS3 = 0
Initial value: BS = 0
F
S
Condition for detecting lost synchronization
0
1
2
0
If 3 consecutive blocks matching the FS3 condition are received.
1
0
If 4 consecutive blocks matching the FS3 condition are received.
0
1
0
If 5 consecutive blocks matching the FS3 condition are received.
1
0
If 6 consecutive blocks matching the FS3 condition are received.
0
1
If 8 consecutive blocks matching the FS3 condition are received.
1
0
1
If 10 consecutive blocks matching the FS3 condition are received.
0
1
If 12 consecutive blocks matching the FS3 condition are received.
1
If 16 consecutive blocks matching the FS3 condition are received.
2. Synchronization detection method setting (1 bit): BS
BS
Synchronization detection conditions
0
If, during 3 blocks, 2 blocks of offset words were detected in the correct order.
1
If the offset words were detected in the correct order in 2 consecutive blocks.
DI
B
0
0 1 0 1
0 1 1 0
B
1
B
2
B
3
A
0
A
1
A
2
A
3
F
S
0
F
S
1
F
S
2
F
S
3
E
C
0
E
C
3
E
C
4
C
T
0
E
C
1
E
C
2
B
S
Y
R
*
O
W
E
[1] CCB address 6A
[2] CCB address 6B
IN1 data, first bit
IN2 data, first bit
(12) Circuit control
(5) Error correction method setting
(4) RAM write control
(3) Synchronization and RAM address reset
(2) Synchronization detection method setting
(1) Synchronization protection method setting
(11) Test mode settings
(10) Output pin settings
(9) RDS/RBDS selection
(8) Demodulation circuit phase control
(7) Crystal oscillator frequency selection
(6) Intermittent DO output setting
(12) Circuit control
DI
B
0
1 1 0 1
0 1 1 0
B
1
B
2
B
3
A
0
A
1
A
2
A
3
C
T
1
S
P
0
S
P
1
P
T
0
T
S
0
T
S
1
T
S
2
T
S
3
P
T
1
P
T
2
X
S
P
L
0
P
L
1
*
R
M
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