参数资料
型号: LIS331HH
厂商: STMICROELECTRONICS
元件分类: 模拟信号调理
英文描述: SPECIALTY ANALOG CIRCUIT, PBCC16
封装: 3 X 3 MM, 1 MM HEIGHT, GREEN, PLASTIC, LGA-16
文件页数: 37/37页
文件大小: 678K
代理商: LIS331HH
LIS331HH
Mechanical and electrical specifications
Doc ID 16366 Rev 1
9/37
2
Mechanical and electrical specifications
2.1
Mechanical characteristics
Table 3.
Mechanical characteristics @ Vdd = 2.5 V, T = 25 °C unless otherwise noted (1)
Symbol
Parameter
Test conditions
Min.
Typ.(2)
Max.
Unit
FS
Measurement range(3)
FS bit set to 00
±6
g
FS bit set to 01
±12
FS bit set to 11
±24
So
Sensitivity
FS bit set to 00
12 bit representation
3
m
g/digit
FS bit set to 01
12 bit representation
6
FS bit set to 11
12 bit representation
12
TCSo
Sensitivity change vs
temperature
FS bit set to 00
±0.01
%/°C
TyOff
Typical zero-
g level offset
accuracy(4),(5)
FS bit set to 00
±70
m
g
TCOff
Zero-
g level change vs
temperature
Max delta from 25 °C
±0.4
m
g/°C
An
Acceleration noise density
FS bit set to 00
650
g/
Vst
Self-test
output change(6),(7),(8)
FS bit set to 00
X axis
50
110
180
LSb
FS bit set to 00
Y axis
-50
-100
-180
LSb
FS bit set to 00
Z axis
220
290
370
LSb
Top
Operating temperature range
-40
+85
°C
Wh
Product weight
20
mgram
1.
The product is factory calibrated at 2.5 V. The operational power supply range is from 2.16 V to 3.6 V.
2.
Typical specifications are not guaranteed
3.
Verified by wafer level test and measurement of initial offset and sensitivity
4.
Typical zero-
g level offset value after MSL3 preconditioning
5.
Offset can be eliminated by enabling the built-in high pass filter
6.
The sign of “Self-test output change” is defined by CTRL_REG4 STsign bit (
Table 27), for all axes.
7.
Self-test output changes with the power supply. “Self-test output change” is defined as
OUTPUT[LSb](CTRL_REG4 ST bit=1) - OUTPUT[LSb](CTRL_REG4 ST bit=0). 1LSb=12g/4096 at 12bit representation, ±6 g Full-
scale
8.
Output data reach 99% of final value after 1/ODR+1ms when enabling self-test mode, due to device filtering
Hz
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