参数资料
型号: LM1851MWC
厂商: NATIONAL SEMICONDUCTOR CORP
元件分类: 电源管理
英文描述: 1-CHANNEL POWER SUPPLY SUPPORT CKT, UUC
封装: WAFER
文件页数: 3/10页
文件大小: 202K
代理商: LM1851MWC
Absolute Maximum Ratings
If MilitaryAerospace specified devices are required
please contact the National Semiconductor Sales
OfficeDistributors for availability and specifications
Supply Current
19 mA
Power Dissipation (Note 1)
1250 mW
Operating Temperature Range
b
40 Cto a70 C
Storage Temperature Range
b
55 Cto a150 C
Soldering Information
Dual-In-Line Package (10 sec)
260 C
Small Outline Package
Vapor Phase (60 sec)
215 C
Infrared (15 sec)
220 C
See AN-450 ‘‘Surface Mounting and Their Effects on Prod-
uct Reliability’’ for other methods of soldering surface
mount devices
DC Electrical Characteristics TAe25 C ISSe5mA
Parameter
Conditions
Min
Typ
Max
Units
Power Supply Shunt
Pin 8 Average Value
22
26
30
V
Regulator Voltage
Latch Trigger Voltage
Pin 7
15
175
20
V
Sensitivity Set Voltage
Pin 8 to Pin 6
6
7
82
V
Output Drive Current
Pin 1 With Fault
05
1
24
mA
Output Saturation Voltage
Pin 1 Without Fault
100
240
mV
Output Saturation Resistance
Pin 1 Without Fault
100
X
Output External Current
Pin 1 Without Fault
20
5
mA
Sinking Capability
Vpin 1 Held to 03V (Note 4)
Noise Integration
Pin 7 Ratio of Discharge
Sink Current Ratio
Currents Between No Fault
20
28
36
m
A mA
and Fault Conditions
AC Electrical Characteristics TAe25 C ISSe5mA
Parameter
Conditions
Min
Typ
Max
Units
Normal Fault Current
Figure 1 (Note 3)
3
5
7
mA
Sensitivity
Normal Fault Trip Time
500X Fault
Figure 2 (Note 2)
18
ms
Normal Fault with
500X Normal Fault
18
ms
Grounded Neutral Fault
2X Neutral
Figure 2 (Note 2)
Trip Time
Note 1
For operation in ambient temperatures above 25 C the device must be derated based on a 125 C maximum junction temperature and a thermal resistance
of 80 CW junction to ambient for the DIP and 162 CW for the SO Package
Note 2
Average of 10 trials
Note 3
Required UL sensitivity tolerance is such that external trimming of LM1851 sensitivity will be necessary
Note 4
This externally applied current is in addition to the internal ‘‘output drive current’’ source
TLH5177 – 2
FIGURE 1 Normal Fault Sensitivity Test Circuit
2
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