参数资料
型号: LM2575TV-012G
厂商: ON Semiconductor
文件页数: 2/28页
文件大小: 0K
描述: IC REG BUCK 12V 1A TO220-5
标准包装: 50
类型: 降压(降压)
输出类型: 固定
输出数: 1
输出电压: 12V
输入电压: 4.75 V ~ 40 V
PWM 型: 电压模式
频率 - 开关: 52kHz
电流 - 输出: 1A
同步整流器:
工作温度: -40°C ~ 125°C
安装类型: 通孔
封装/外壳: TO-220-5 成形引线
包装: 管件
供应商设备封装: TO-220-5
LM2575, NCV2575
Typical Application (Fixed Output Voltage Versions)
Feedback
7.0 V - 40 V
Unregulated
DC Input
C in
100 m F
+V in
1
LM2575
3 GND 5
4
Output
2
ON/OFF
L1
330 m H
D1
1N5819
C out
330 m F
5.0 V Regulated
Output 1.0 A Load
Representative Block Diagram and Typical Application
Unregulated
DC Input
+V in
1
3.1 V Internal
Regulator
ON/OFF
ON/OFF
5
Output
Voltage Versions
R2
( W )
C in
4
3.3 V
5.0 V
12 V
1.7 k
3.1 k
8.84 k
Feedback
Current
15 V
11.3 k
R2
Fixed Gain
Error Amplifier Comparator
Limit
For adjustable version
R1 = open, R2 = 0 W
R1
1.0 k
Freq
Shift
Latch
Driver
Output
L1
Regulated
Output
V out
18 kHz
1.0 Amp
2
1.235 V
Band-Gap
Reference
52 kHz
Oscillator
Reset
Thermal
Shutdown
Switch
GND
3
D1
C out
Load
This device contains 162 active transistors.
Figure 1. Block Diagram and Typical Application
ABSOLUTE MAXIMUM RATINGS (Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.)
Rating
Maximum Supply Voltage
ON/OFF Pin Input Voltage
Output Voltage to Ground (Steady ? State)
Symbol
V in
?
?
Value
45
? 0.3 V ≤ V ≤ +V in
? 1.0
Unit
V
V
V
Power Dissipation
Case 314B and 314D (TO ? 220, 5 ? Lead)
Thermal Resistance, Junction ? to ? Ambient
Thermal Resistance, Junction ? to ? Case
Case 936A (D 2 PAK)
Thermal Resistance, Junction ? to ? Ambient (Figure 34)
Thermal Resistance, Junction ? to ? Case
Storage Temperature Range
Minimum ESD Rating (Human Body Model: C = 100 pF, R = 1.5 k W )
Lead Temperature (Soldering, 10 s)
Maximum Junction Temperature
P D
R q JA
R q JC
P D
R q JA
R q JC
T stg
?
?
T J
Internally Limited
65
5.0
Internally Limited
70
5.0
? 65 to +150
2.0
260
150
W
° C/W
° C/W
W
° C/W
° C/W
° C
kV
° C
° C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
http://onsemi.com
2
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