参数资料
型号: LPC11E13FBD48/301,
厂商: NXP Semiconductors
文件页数: 4/8页
文件大小: 0K
描述: IC MCU 32BIT 24K 48LQFP
产品培训模块: Code Density for LPC11xx
标准包装: 250
系列: LPC11Exx
核心处理器: ARM? Cortex?-M0
芯体尺寸: 32-位
速度: 50MHz
连通性: I²C,Microwire,SPI,SSI,SSP,UART/USART
外围设备: 欠压检测/复位,POR,WDT
输入/输出数: 40
程序存储器容量: 24KB(24K x 8)
程序存储器类型: 闪存
EEPROM 大小: 2K x 8
RAM 容量: 8K x 8
电压 - 电源 (Vcc/Vdd): 1.8 V ~ 3.6 V
数据转换器: A/D 8x10b
振荡器型: 内部
工作温度: -40°C ~ 85°C
封装/外壳: 48-LQFP
包装: 托盘
其它名称: 568-8572
ES_LPC11E1X
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2013. All rights reserved.
Errata sheet
Rev. 2 — 1 February 2013
4 of 8
NXP Semiconductors
ES_LPC11E1x
Errata sheet LPC11E1x
3.
Functional problems detail
3.1 ADC.1: A/D Global Data register should not be used with burst mode
or hardware triggering
Introduction:
On the LPC11E1x, the START field and the BURST bit in the A/D control register specify
whether A/D conversions are initiated via software command, in response to some
hardware trigger, or continuously in burst ("hardware-scan") mode. Results of the ADC
conversions can be read in one of two ways. One is to use the A/D Global Data Register
to read all data from the ADC. Another is to use the individual A/D Channel Data
Registers.
Problem:
If the burst mode is enabled (BURST bit set to ‘1’) or if hardware triggering is specified,
the A/D conversion results read from the A/D Global Data register could be incorrect. If
conversions are only launched directly by software command (BURST bit = '0' and START
= ‘001’), the results read from the A/D Global Data register will be correct provided the
previous result is read prior to launching a new conversion.
Work-around:
When using either burst mode or hardware triggering, the individual A/D Channel Data
registers should be used instead of the A/D Global Data register to read the A/D
conversion results.
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