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参数资料
| 型号： | LTC2411IMS#TR |
| 厂商： | Linear Technology |
| 文件页数： | 11/40页 |
| 文件大小： | 0K |
| 描述： | IC A/D CONV 24BIT MICRPWR 10MSOP |
| 标准包装： | 2,500 |
| 位数： | 24 |
| 采样率（每秒）： | 7.5 |
| 数据接口： | MICROWIRE?，串行，SPI? |
| 转换器数目： | 2 |
| 功率耗散（最大）： | 1mW |
| 电压电源： | 单电源 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 10-TFSOP，10-MSOP（0.118"，3.00mm 宽） |
| 供应商设备封装： | 10-MSOP |
| 包装： | 带卷 (TR) |
| 输入数目和类型： | 1 个差分，双极 |
| 其它名称： | LTC2411IMSTR |
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LTC2411/LTC2411-1
19
In order to select the internal serial clock timing mode, the
serial clock pin (SCK) must be floating (Hi-Z) or pulled
HIGH prior to the falling edge of CS. The device will not
enter the internal serial clock mode if SCK is driven LOW
on the falling edge of CS. An internal weak pull-up resistor
is active on the SCK pin during the falling edge of CS;
therefore, the internal serial clock timing mode is auto-
matically selected if SCK is not externally driven.
The serial data output pin (SDO) is Hi-Z as long as CS is
HIGH. At any time during the conversion cycle, CS may be
pulled LOW in order to monitor the state of the converter.
Once CS is pulled LOW, SCK goes LOW and EOC is output
to the SDO pin. EOC = 1 while a conversion is in progress
and EOC = 0 if the device is in the sleep state.
When testing EOC, if the conversion is complete (EOC = 0),
the device will exit the sleep state and enter the data output
state if CS remains LOW. In order to prevent the device
from exiting the low power sleep state, CS must be pulled
HIGH before the first rising edge of SCK. In the internal
SCK timing mode, SCK goes HIGH and the device begins
outputting data at time tEOCtest after the falling edge of CS
(if EOC = 0) or tEOCtest after EOC goes LOW (if CS is LOW
during the falling edge of EOC). The value of tEOCtest is 23s
if the device is using its internal oscillator for the LTC2411
(FO = logic LOW or HIGH) and 26s for the LTC2411-1
(FO = logic LOW). If FO is driven by an external oscillator
of frequency fEOSC, then tEOCtest is 3.6/fEOSC. If CS is pulled
HIGH before time tEOCtest, the device remains in the sleep
state. The conversion result is held in the internal static
shift register.
If CS remains LOW longer than tEOCtest, the first rising
edge of SCK will occur and the conversion result is serially
shifted out of the SDO pin. The data output cycle begins on
this first rising edge of SCK and concludes after the 32nd
rising edge. Data is shifted out the SDO pin on each falling
edge of SCK. The internally generated serial clock is output
to the SCK pin. This signal may be used to shift the
conversion result into external circuitry. EOC can be
latched on the first rising edge of SCK and the last bit of the
conversion result on the 32nd rising edge of SCK. After the
32nd rising edge, SDO goes HIGH (EOC = 1), SCK stays
HIGH and a new conversion starts.
Typically, CS remains LOW during the data output state.
However, the data output state may be aborted by pulling
CS HIGH anytime between the first and 32nd rising edge
of SCK, see Figure 9. On the rising edge of CS, the device
Figure 9. Internal Serial Clock, Reduced Data Output Length
SDO
SCK
(INTERNAL)
CS
>tEOCtest
MSB
SIG
BIT 8
TEST EOC
BIT 27
BIT 26
BIT 28
BIT 29
BIT 30
EOC
BIT 31
EOC
BIT 0
SLEEP
DATA OUTPUT
Hi-Z
DATA OUTPUT
CONVERSION
SLEEP
2411 F09
<tEOCtest
VCC
10k
TEST EOC
VCC
FO
REF+
REF–
SCK
IN+
IN–
SDO
GND
CS
110
2
3
9
4
5
8
6
7
REFERENCE
VOLTAGE
0.1V TO VCC
ANALOG INPUT RANGE
–0.5VREF TO 0.5VREF
3-WIRE
SPI INTERFACE
1
F
2.7V TO 5.5V
= 50Hz REJECTION (LTC2411)
= EXTERNAL OSCILLATOR
= 60Hz REJECTION (LTC2411)
= SIMULTANEOUS 50Hz/60Hz REJECTION (LTC2411-1)
VCC
LTC2411/
LTC2411-1
APPLICATIO S I FOR ATIO
WU
UU
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