参数资料
型号: LTC6803IG-1#TRPBF
厂商: Linear Technology
文件页数: 5/40页
文件大小: 0K
描述: IC MONITOR BATT STACK 44-SSOP
标准包装: 2,000
功能: 电池监控器,过压/欠压保护
电池化学: 多化学成分,超级电容器
电源电压: 4 V ~ 55 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 44-FSOP(0.209",5.30mm 宽)
供应商设备封装: 44-SSOP
包装: 带卷 (TR)
LTC6803-1/LTC6803-3
ELECTRICAL CHARACTERISTICS The l denotes the specifications which apply over the full operating
temperature range, otherwise specifications are at T A = 25°C. V + = 43.2V, V – = 0V, unless otherwise noted.
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
Voltage Mode Digital I/O
V IH
V IL
V OL
I IN
Digital Input Voltage High
Digital Input Voltage Low
Digital Output Voltage Low
Digital Input Current
Pins SCKI, SDI and CSBI
Pins SCKI, SDI and CSBI
Pin SDO, Sinking 500μA
V MODE , TOS, SCKI, SDI, CSBI
l
l
l
l
2
0.8
0.3
10
V
V
V
μA
Current Mode Digital I/O
I IH1
Digital Input Current High
Pins CSBI, SCKI, SDI (Write, Pin Sourcing)
l
3
10
μA
I IL1
I IH2
I IL2
Digital Input Current Low
Digital Input Current High
Digital Input Current Low
CSBI, SCKI, SDI (Write, Pin Sourcing)
SDOI (Read, Pin Sinking)
SDOI (Read, Pin Sinking)
l
l
l
1000
1000
10
μA
μA
μA
I OH1
Digital Output Current High
CSBO, SCKO, SDOI (Write, Pin Sinking)
l
3
10
μA
I OL1
I OH2
I OL2
Digital Output Current Low
Digital Output Current High
Digital Output Current Low
CSBO, SCKO, SDOI(Write, Pin Sinking)
SDI (Read, Pin Sourcing)
SDI (Read, Pin Sourcing)
l
l
l
1000
1000
1300
1300
3
1600
1600
10
μA
μA
μA
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: The ADC specifications are guaranteed by the Total Measurement
Error (V ERR ) specification.
Note 3: Due to the contact resistance of the production tester, this
specification is tested to relaxed limits. The 20Ω limit is guaranteed by
design.
Note 5: These absolute maximum ratings apply provided that the voltage
between inputs do not exceed the absolute maximum ratings.
Note 6: Supply current is tested during continuous measuring. The supply
current during periodic measuring (130ms, 500ms, 2s) is guaranteed by
design.
Note 7: The CDC = 5, 6 and 7 supply currents are not measured. They are
guaranteed by the CDC = 2 supply current measurement.
Note 8: Limit is determined by high speed automated test capability.
Note 4: V CELL refers to the voltage applied across C n to C n – 1 for
n = 1 to 12. V TEMP refers to the voltage applied from V TEMP1 or V TEMP2
to V – .
TYPICAL PERFORMANCE CHARACTERISTICS
Cell Measurement Error
vs Cell Input Voltage
Cell Measurement Error
vs Input RC Values
Cell Measurement Error
vs Input RC Values
4.5
3.0
1.5
T A = 125°C
T A = 85°C
T A = 25°C
T A = –40°C
5
0
–5
0
–5
–10
CELLS 2 TO 12, 13ms CELL
MEASUREMENT REPETITION
V CELL = 3.3V
0
–1.5
–3.0
–4.5
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
CELL INPUT VOLTAGE (V)
–10
–15
–20
–25
–30
0
C = 0μF
C = 0.1μF
C = 1μF
C = 3.3μF
CELL 1, 13ms CELL MEASUREMENT
REPETITION
V CELL = 3.3V
1 2 3 4 5 6 7 8
INPUT RESISTANCE (k )
9
10
–15
–20
–25
–30
0
1
C = 0μF
C = 0.1μF
C = 1μF
C = 3.3μF
2 3 4 5 6 7
INPUT RESISTANCE (k )
8
9
10
680313 G01
680313 G02
680313 G03
680313fa
5
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