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参数资料
| 型号： | M27C800-120XF6TR |
| 厂商： | 意法半导体 |
| 英文描述： | 8 Mbit 1Mb x8 or 512Kb x16 UV EPROM and OTP EPROM |
| 中文描述： | 8兆1兆x8或512KB的x16紫外线存储器和OTP存储器 |
| 文件页数： | 4/18页 |
| 文件大小： | 171K |
| 代理商： | M27C800-120XF6TR |
M27C800
4/18
DEVICE OPERATION
The operating modes of the M27C800 are listed in
the Operating Modes Table. A single power supply
is required in the read mode. All inputs are TTL
compatible except for V
PP
and 12V on A9 for the
Electronic Signature.
Read Mode
The M27C800 has two organisations, Word-wide
and Byte-wide. The organisation is selected by the
signal level on the BYTEV
PP
pin. When BYTEV
PP
is at V
IH
the Word-wide organisation is selected
and the Q15A–1 pin is used for Q15 Data Output.
When the BYTEV
PP
pin is at V
IL
the Byte-wide or-
ganisation is selected and the Q15A–1 pin is used
for the Address Input A–1. When the memory is
logically regarded as 16 bit wide, but read in the
Byte-wide organisation, then with A–1 at V
IL
the
lower 8 bits of the 16 bit data are selected and with
A–1 at V
IH
the upper 8 bits of the 16 bit data are
selected.
The M27C800 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. In addition the Word-wide or
Byte- wide organisation must be selected.
Chip Enable (E) is the power control and should be
used for device selection. Output Enable (G) is the
output control and should be used to gate data to
the output pins independent of device selection.
Assuming that the addresses are stable, the ad-
dress access time (t
AVQV
) is equal to the delay
from E to output (t
ELQV
). Data is available at the
output after a delay of t
GLQV
from the falling edge
of G, assuming that E has been low and the ad-
dresses have been stable for at least t
AVQV
-t
GLQV
.
Table 5. AC Measurement Conditions
High Speed
Standard
Input Rise and Fall Times
≤
10ns
≤
20ns
Input Pulse Voltages
0 to 3V
0.4V to 2.4V
Input and Output Timing Ref. Voltages
1.5V
0.8V and 2V
Figure 3. AC Testing Input Output Waveform
AI01822
3V
High Speed
0V
1.5V
2.4V
Standard
0.4V
2.0V
0.8V
Figure 4. AC Testing Load Circuit
AI01823B
1.3V
OUT
CL
CL = 30pF for High Speed
CL = 100pF for Standard
CL includes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
相关PDF资料 |
PDF描述 |
|---|---|
| M27C800-120XF1TR | Octal Buffer/Driver With 3-State Outputs 20-TSSOP -40 to 85 |
| M27C800-120M6TR | Octal Buffer/Driver With 3-State Outputs 20-TSSOP -40 to 85 |
| M27C801-100B | 8 Mbit 1Mb x 8 UV EPROM and OTP EPROM |
| M27C801-120F | 8 Mbit 1Mb x 8 UV EPROM and OTP EPROM |
| M27C801-100B1TR | 8 Mbit 1Mb x 8 UV EPROM and OTP EPROM |
相关代理商/技术参数 |
参数描述 |
|---|---|
| M27C801-100B1 | 功能描述:可擦除可编程ROM 8M (1Mx8) 100ns RoHS:否 制造商:Maxim Integrated 类型: 存储容量:1024 bit 组织:1 K x 1 接口类型: 工作电流:5 uA 编程电压: 工作电源电压:2.8 V to 6 V 最大工作温度:+ 85 C 安装风格:Through Hole 封装 / 箱体:TO-92 |
| M27C801-100B1 | 制造商:STMicroelectronics 功能描述:PROM OTP CMOS 8MB 27C801 DIP32 |
| M27C801-100F1 | 功能描述:可擦除可编程ROM 8M (1Mx8) 100ns RoHS:否 制造商:Maxim Integrated 类型: 存储容量:1024 bit 组织:1 K x 1 接口类型: 工作电流:5 uA 编程电压: 工作电源电压:2.8 V to 6 V 最大工作温度:+ 85 C 安装风格:Through Hole 封装 / 箱体:TO-92 |
| M27C801-100F1 | 制造商:STMicroelectronics 功能描述:IC EPROM CMOS 8MB 27C801 DIP32 |
| M27C801-100F6 | 功能描述:可擦除可编程ROM 8M (1Mx8) 100ns RoHS:否 制造商:Maxim Integrated 类型: 存储容量:1024 bit 组织:1 K x 1 接口类型: 工作电流:5 uA 编程电压: 工作电源电压:2.8 V to 6 V 最大工作温度:+ 85 C 安装风格:Through Hole 封装 / 箱体:TO-92 |
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