参数资料
型号: M27V201-200XK6TR
厂商: 意法半导体
元件分类: 保险丝支架,夹子&硬件
英文描述: Fuse Holder; Mounting Type:PC Board; For Use With:PC Board Fuses; Leaded Process Compatible:No; Peak Reflow Compatible (260 C):No; Voltage Rating, AC:250V; Voltage Rating, DC:450V; Accessory Type:Mounting Socket
中文描述: 2兆位的256Kb × 8低压紫外线可擦写可编程只读存储器和OTP存储器
文件页数: 4/15页
文件大小: 103K
代理商: M27V201-200XK6TR
M27V201
4/15
Two Line Output Control
Because EPROMs are usually used in larger
memory arrays, this product features a 2 line con-
trol function which accommodates the use of mul-
tiple memory connection. The two line control
function allows:
a. the lowest possible memory power dissipation
b. complete assurance that output bus contention
will not occur.
For the most efficient use of these two control
lines, Eshould be decodedand used as theprima-
ry device selecting function, while G should be
made a common connection to all devices in the
array and connected to the READ line from the
system controlbus. This ensures that all deselect-
ed memory devices are in their lowpower standby
mode and that the output pins are only active
when data is required from a particular memory
device.
System Considerations
The power switching characteristics of Advanced
CMOS EPROMs require careful decoupling of the
devices. The supply current, I
CC
, has three seg-
ments that are of interest to the system designer:
the standby current level, the active current level,
and transient current peaks that are produced by
the fallingand rising edges of E. The magnitude of
the transient current peaks is dependent on the
capacitive and inductive loading of the device at
the output.
Table 5. AC Measurement Conditions
High Speed
Standard
Input Rise and Fall Times
10ns
20ns
Input Pulse Voltages
0 to 3V
0.4V to 2.4V
Input and Output Timing Ref. Voltages
1.5V
0.8V and 2V
Figure 3. AC Testing Input Output Waveform
AI01822
3V
High Speed
0V
1.5V
2.4V
Standard
0.4V
2.0V
0.8V
Figure 4. AC Testing Load Circuit
AI01823B
1.3V
OUT
CL
CL= 30pF for High Speed
CL= 100pF for Standard
CLincludes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
Table 6. Capacitance
(1)
(T
A
= 25
°
C, f = 1 MHz)
Symbol
Note: Sampled only, not 100% tested.
Parameter
Test Condition
Min
Max
Unit
C
IN
Input Capacitance
V
IN
= 0V
6
pF
C
OUT
Output Capacitance
V
OUT
= 0V
12
pF
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