参数资料
型号: M28C17-150K1T
厂商: 意法半导体
英文描述: CAP 330UF 10V ELECT MZA SMD
中文描述: 16K的2K × 8的并行EEPROM,带有软件数据保护
文件页数: 7/17页
文件大小: 165K
代理商: M28C17-150K1T
Symbol
Alt
Parameter
Test
Condition
M28C17
Unit
-90
-120
-150
min
max
min
max
min
max
t
AVQV
t
ACC
Address Valid to
Output Valid
E = V
IL
,
G = V
IL
90
120
150
ns
t
ELQV
t
CE
Chip Enable Low to
Output Valid
G = V
IL
90
120
150
ns
t
GLQV
t
OE
Output Enable Low
to Output Valid
E = V
IL
40
45
50
ns
t
EHQZ (1)
t
DF
Chip Enable High
to Output Hi-Z
G = V
IL
0
40
0
45
0
50
ns
t
GHQZ (1)
t
DF
Output Enable High
to Output Hi-Z
E = V
IL
0
40
0
45
0
50
ns
t
AXQX
t
OH
Address Transition
to Output Transition
E = V
IL
,
G = V
IL
0
0
0
ns
Note:
1. Output Hi-Z is defined as the point at which data is no longer driven.
Table 8. Read Mode AC Characteristics
(T
A
= 0 to 70
°
C or –40 to 85
°
C; V
CC
= 4.5V to 5.5V)
AI01511B
VALID
tAVQV
tAXQX
tGLQV
tEHQZ
tGHQZ
DATA OUT
A0-A10
E
G
DQ0-DQ7
tELQV
Hi-Z
Figure 9. Read Mode AC Waveforms
Note:
Write Enable (W) = High
7/17
M28C17
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