参数资料
型号: M312L2920BG0-CB3
厂商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: DDR SDRAM Registered Module
中文描述: DDR SDRAM的注册模块
文件页数: 13/23页
文件大小: 258K
代理商: M312L2920BG0-CB3
DDR SDRAM
512MB, 1GB, 2GB TSOP Registered DIMM
Revison 1.0 December, 2003
AC Timming Parameters & Specifications
Parameter
Symbol
AA
(DDR266@CL=2)
A2
(DDR266@CL=2)
B0
(DDR266@CL=2.5)
A0
(DDR200@CL=2)
Unit
Note
Mn
Max
Min
Max
Mn
Max
Min
Max
Row cycle time
tRC
60
65
65
70
ns
Refresh row cycle time
tRFC
75
75
75
80
ns
Row active time
tRAS
45
120K
45
120K
45
120K
48
120K
ns
RAS to CAS delay
tRCD
15
20
20
20
ns
Row precharge time
tRP
15
20
20
20
ns
Row active to Row active delay
tRRD
15
15
15
15
ns
Write recovery time
tWR
15
15
15
15
ns
Last data in to Read command
tWTR
1
1
1
1
tCK
Col. address to Col. address delay
tCCD
1
1
1
1
tCK
Clock cycle time
CL=2.0
tCK
7.5
12
7.5
12
10
12
10
12
ns
CL=2.5
7.5
12
7.5
12
7.5
12
ns
Clock high level width
tCH
0.45
0.55
0.45
0.55
0.45
0.55
0.45
0.55
tCK
Clock low level width
tCL
0.45
0.55
0.45
0.55
0.45
0.55
0.45
0.55
tCK
DQS-out access time fromCK/CK
tDQSCK
-0.75
+0.75
-0.75
+0.75
-0.75
+0.75
-0.8
+0.8
ns
Output data access time fromCK/CK
tAC
-0.75
+0.75
-0.75
+0.75
-0.75
+0.75
-0.8
+0.8
ns
Data strobe edge to ouput data edge
tDQSQ
-
0.5
-
0.5
-
0.5
-
0.6
ns
12
Read Preamble
tRPRE
0.9
1.1
0.9
1.1
0.9
1.1
0.9
1.1
tCK
Read Postamble
tRPST
0.4
0.6
0.4
0.6
0.4
0.6
0.4
0.6
tCK
CK to valid DQS-in
tDQSS
0.75
1.25
0.75
1.25
0.75
1.25
0.75
1.25
tCK
DQS-in setup time
tWPRES
0
0
0
0
ns
3
DQS-in hold time
tWPRE
0.25
0.25
0.25
0.25
tCK
DQS falling edge to CK rising-setup time
tDSS
0.2
0.2
0.2
0.2
tCK
DQS falling edge fromCK rising-hold time
tDSH
0.2
0.2
0.2
0.2
tCK
DQS-in high level width
tDQSH
0.35
0.35
0.35
0.35
tCK
DQS-in low level width
tDQSL
0.35
0.35
0.35
0.35
tCK
DQS-in cycle time
tDSC
0.9
1.1
0.9
1.1
0.9
1.1
0.9
1.1
tCK
Address and Control Input setup time(fast)
tIS
0.9
0.9
0.9
1.1
ns
i,5.7~9
Address and Control Input hold time(fast)
tIH
0.9
0.9
0.9
1.1
ns
i,5.7~9
Address and Control Input setup time(slow)
tIS
1.0
1.0
1.0
1.1
ns
i, 6~9
Address and Control Input hold time(slow)
tIH
1.0
1.0
1.0
1.1
ns
i, 6~9
Data-out high impedence time fromCK/CK
tHZ
-0.75
+0.75
-0.75
+0.75
-0.75
+0.75
-0.8
+0.8
ns
1
Data-out low impedence time fromCK/CK
tLZ
-0.75
+0.75
-0.75
+0.75
-0.75
+0.75
-0.8
+0.8
ns
1
Input Slew Rate(for input only pins)
tSL(I)
0.5
0.5
0.5
0.5
V/ns
Input Slew Rate(for I/O pins)
tSL(IO)
0.5
0.5
0.5
0.5
V/ns
Output Slew Rate(x4,x8)
tSL(O)
1.0
4.5
1.0
4.5
1.0
4.5
1.0
4.5
V/ns
Output Slew Rate Matching Ratio
(rise to
fall)
tSLMR
0.67
1.5
0.67
1.5
0.67
1.5
0.67
1.5
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